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A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.
Yen-Pu Chen
Bikram Kishore Mahajan
Dhanoop Varghese
Srikanth Krishnan
Vijay Reddy
Muhammad Ashraful Alam
Published in:
IRPS (2020)
Keyphrases
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infrared
x ray
high density
power system
power consumption
high voltage
mobile agents
field effect transistors
mobility patterns
mobile phone
thresholding method
threshold selection
adaptive threshold