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A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.

Yen-Pu ChenBikram Kishore MahajanDhanoop VargheseSrikanth KrishnanVijay ReddyMuhammad Ashraful Alam
Published in: IRPS (2020)
Keyphrases
  • infrared
  • x ray
  • high density
  • power system
  • power consumption
  • high voltage
  • mobile agents
  • field effect transistors
  • mobility patterns
  • mobile phone
  • thresholding method
  • threshold selection
  • adaptive threshold