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High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.

SangHoon ShinYen-Pu ChenWoojin AhnHonglin GuoByron WilliamsJeff WestTom BonifieldDhanoop VargheseSrikanth KrishnanMuhammad Ashraful Alam
Published in: IRPS (2018)
Keyphrases
  • high voltage
  • operating conditions
  • travel time
  • transmission line
  • leakage current
  • partial discharge
  • normal operation
  • data mining
  • case based reasoning