LEAKAGE CURRENT
Experts
- Ming-Dou Ker
- Dennis Sylvester
- David T. Blaauw
- Volkan Kursun
- Vivek De
- Kaushik Roy
- James W. Tschanz
- Kevin Zhang
- Takayasu Sakurai
- Fatih Hamzaoglu
- Ching-Te Chuang
- Yih Wang
- Rajiv V. Joshi
- Chris H. Kim
- Anantha P. Chandrakasan
- Uddalak Bhattacharya
- Koji Nii
- Saibal Mukhopadhyay
- Gérard Ghibaudo
- Benton H. Calhoun
- Hung-Jen Liao
- Seong-Ook Jung
- Shun'ichiro Ohmi
- Amara Amara
- Amit Agarwal
- Hei Wong
- Steven Hsu
- Himanshu Kaul
- Jonathan Chang
- Bastien Giraud
- Taejoong Song
- Manoj Sachdev
- Hiroshi Iwai
- Yong-Gee Ng
- Mark A. Anders
- Krishnan Ravichandran
- Quincy Li
- Sanu Mathew
- Ram Krishnamurthy
Venues
- Microelectron. Reliab.
- IEEE J. Solid State Circuits
- Microelectron. J.
- ISCAS
- IRPS
- ISSCC
- IEEE Access
- IEICE Trans. Electron.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Ind. Electron.
- ICECS
- CICC
- IEEE Trans. Circuits Syst. II Express Briefs
- Sensors
- VLSI Design
- ESSCIRC
- ISQED
- IEICE Electron. Express
- ESSDERC
- MWSCAS
- SoCC
- NEMS
- DRC
- J. Circuits Syst. Comput.
- CoRR
- CCE
- IEEE Trans. Circuits Syst. I Regul. Pap.
- VLSI Circuits
- ICICDT
- J. Low Power Electron.
- OFC
- IEEE Trans. Instrum. Meas.
- ISLPED
- ITC
- ICCD
- IECON
- VLSI Technology and Circuits
- ISCAS (1)
- VDAT
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