Hei Wong

Publication Activity (10 Years)

Years Active: 2001-2023
Publications (10 Years): 13

Top Topics

Silicon Dioxide

Random Number Generator

Top Venues

Microelectron. Reliab.

Microelectron. J.

IEEE Trans. Circuits Syst. I Regul. Pap.

IEEE Trans. Circuits Syst. II Express Briefs

Publications

Jinfa Hong, Hei Wong, Oliver C. S. Choy, Ray C. C. Cheung
A Platform for Adaptive Interference Mitigation and Intent Analysis Using OpenLANE. ICSPCC (2023)
Hei Wong, Shurong Dong, Zehua Chen
Effects of non-fatal electrostatic discharge on the threshold voltage degradation in nano CMOS devices. Sci. China Inf. Sci. 65 (2) (2022)
Shuk-Fun Lai, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
CMOS low power split-drain MAGFET based magnetic field strength sensor. Microelectron. J. 100 (2020)
Yao Liu, Xiao-Zhou Li, Ray C. C. Cheung, Sze-Chun Chan, Hei Wong
High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser Inputs. IEEE Trans. Circuits Syst. II Express Briefs (6) (2018)
Yao Liu, Ray C. C. Cheung, Hei Wong
Lightweight Secure Processor Prototype on FPGA. FPL (2018)
Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. Microelectron. Reliab. (2018)
Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou
A double snapback SCR ESD protection scheme for 28 nm CMOS process. Microelectron. Reliab. 84 (2018)
Yao Liu, Ray C. C. Cheung, Hei Wong
A Bias-Bounded Digital True Random Number Generator Architecture. IEEE Trans. Circuits Syst. I Regul. Pap. (1) (2017)
Xuan Feng, Shurong Dong, Hei Wong, Danqun Yu, Kin Leong Pey, Kalya Shubhakar, W. S. Lau
stack. Microelectron. Reliab. 61 (2016)
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
Editorial. Microelectron. Reliab. 61 (2016)
Danqun Yu, W. S. Lau, Hei Wong, Xuan Feng, Shurong Dong, Kin Leong Pey
/W MIM capacitors with the thickness of the bottom W electrode. Microelectron. Reliab. 61 (2016)
Lixia Sun, Jianxin Zhu, Hei Wong
Simulation and evaluation of the peak temperature in LED light bulb heatsink. Microelectron. Reliab. 61 (2016)
Zhihui Yu, Hao Jin, Shurong Dong, Hei Wong, Jie Zeng, Weihuai Wang
Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. Microelectron. Reliab. 61 (2016)
Zehua Chen, Weiyin Wang, Hei Wong
Low-voltage CMOS DC-DC converters for energy harvesting applications. ASICON (2015)
Wing-Shan Tam, Chi-Wah Kok, Hei Wong
Optimization of loss tangent and capacitor size of micro-vacuum dielectric capacitors. Microelectron. J. 46 (12) (2015)
Weiyin Wang, Hei Wong, Yan Han
A high-efficiency full-wave CMOS rectifying charge pump for RF energy harvesting applications. Microelectron. J. 46 (12) (2015)
Oi-Ying Wong, Hei Wong, Wing-Shan Tam, Chi-Wah Kok
A dynamic-biasing 4× charge pump based on exponential topology. Int. J. Circuit Theory Appl. 43 (3) (2015)
Zehua Chen, Hei Wong, Yan Han, Shurong Dong, B. L. Yang
Temperature dependences of threshold voltage and drain-induced barrier lowering in 60 nm gate length MOS transistors. Microelectron. Reliab. 54 (6-7) (2014)
Xuan Feng, Hei Wong, B. L. Yang, Shurong Dong, Hiroshi Iwai, Kuniyuki Kakushima
stacked gate dielectric. Microelectron. Reliab. 54 (6-7) (2014)
Wing-Shan Tam, Chi-Wah Kok, Sik-Lam Siu, Hei Wong
Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology. Microelectron. Reliab. 54 (6-7) (2014)
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
Special section reliability and variability of devices for circuits and systems. Microelectron. Reliab. 54 (6-7) (2014)
Wing-Shan Tam, Chi-Wah Kok, Sik-Lam Siu, Wing-Man Tang, Chi-Wah Leung, Hei Wong
Thermal stability of sectorial split-drain magnetic field-effect transistors. Microelectron. Reliab. 54 (6-7) (2014)
Ekachai Leelarasmee, Hei Wong
Editorial. J. Circuits Syst. Comput. 22 (9) (2013)
Hei Wong, B. L. Yang, Shurong Dong
Thermal and voltage instabilities of hafnium oxide films prepared by sputtering technique. Microelectron. Reliab. 53 (12) (2013)
J. Liu, Hei Wong, Sik-Lam Siu, Chi-Wah Kok, V. Filip
Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing. Microelectron. Reliab. 52 (8) (2012)
Asen Asenov, Ulf Schlichtmann, Cher Ming Tan, Hei Wong, Xing Zhou
ICMAT 2011 - Reliability and variability of semiconductor devices and ICs. Microelectron. Reliab. 52 (8) (2012)
Oi-Ying Wong, Hei Wong, Wing-Shan Tam, Ted Chi-Wah Kok
A comparative study of charge pumping circuits for flash memory applications. Microelectron. Reliab. 52 (4) (2012)
Hei Wong
Advances in non-volatile memory technology. Microelectron. Reliab. 52 (4) (2012)
B. L. Yang, Hei Wong, Kuniyuki Kakushima, Hiroshi Iwai
stacked gate dielectric. Microelectron. Reliab. 52 (8) (2012)
S.-L. Siu, Wing-Shan Tam, Hei Wong, Chi-Wah Kok, K. Kakusima, Hiroshi Iwai
Influence of multi-finger layout on the subthreshold behavior of nanometer MOS transistors. Microelectron. Reliab. 52 (8) (2012)
Wing-Shan Tam, Sik-Lam Siu, Oi-Ying Wong, Chi-Wah Kok, Hei Wong, V. Filip
Modeling of terminal ring structures for high-voltage power MOSFETs. Microelectron. Reliab. 52 (8) (2012)
Oi-Ying Wong, Hei Wong, Wing-Shan Tam, Chi-Wah Kok
An overview of charge pumping circuits for flash memory applications. ASICON (2011)
Wing-Shan Tam, Sik-Lam Siu, Bing-Liang Yang, Chi-Wah Kok, Hei Wong
Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation. Microelectron. Reliab. 51 (12) (2011)
Wing-Shan Tam, Oi-Ying Wong, Chi-Wah Kok, Hei Wong
Generating sub-1V reference voltages from a resistorless CMOS bandgap reference circuit by using a piecewise curvature temperature compensation technique. Microelectron. Reliab. 50 (8) (2010)
Wing-Shan Tam, Oi-Ying Wong, Ka-Yan Mok, Chi-Wah Kok, Hei Wong
An Energy Efficient Half-Static Clock-Gating d-Type flip-Flop. J. Circuits Syst. Comput. 19 (3) (2010)
Yu. N. Novikov, A. V. Vishnyakov, V. A. Gritsenko, K. A. Nasyrov, Hei Wong
with multiphonon trap ionization effect. Microelectron. Reliab. 50 (2) (2010)
Wing-Shan Tam, Oi-Ying Wong, Tsz-Ching Ng, Chi-Wah Kok, Hei Wong
Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure. Microelectron. Reliab. 50 (5) (2010)
Oi-Ying Wong, Wing-Shan Tam, Jun Liu, Oi-Kan Shea, Shiu Hung Cheung, Chi-Wah Kok, Hei Wong
Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors. Microelectron. Reliab. 50 (5) (2010)
Sik-Lam Siu, Hei Wong, Wing-Shan Tam, Kuniyuki Kakushima, Hiroshi Iwai
Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors. Microelectron. Reliab. 49 (4) (2009)
Hei Wong, Y. Fu, Juin J. Liou, Y. Yue
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors. Microelectron. Reliab. 49 (1) (2009)
Oi-Ying Wong, Wing-Shan Tam, Oi-Kan Shea, Shiu Hung Cheung, Jun Liu, Chi-Wah Kok, Hei Wong
Effects of periphery encapsulation material on the characteristics of micro vacuum dielectric capacitor. Microelectron. Reliab. 49 (5) (2009)
Jun Liu, Wing-Shan Tam, Hei Wong, V. Filip
Temperature-dependent light-emitting characteristics of InGaN/GaN diodes. Microelectron. Reliab. 49 (1) (2009)
Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
× Switched Capacitor Charge Pump. ISCAS (2009)
Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
Design strategy for 2-phase switched capacitor charge pump. APCCAS (2008)
C. K. Wong, Hei Wong, Mansun Chan, Y. T. Chow, H. P. Chan
Silicon oxynitride integrated waveguide for on-chip optical interconnects applications. Microelectron. Reliab. 48 (2) (2008)
Oi-Ying Wong, Wing-Shan Tam, Chi-Wah Kok, Hei Wong
Current mode track and hold circuit with 50MS/sec speed and 8-bit resolution. APCCAS (2008)
Banani Sen, Bing-Liang Yang, Hei Wong, Chi-Wah Kok, P. K. Chu, A. Huang
Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation. Microelectron. Reliab. 48 (11-12) (2008)
Wing-Shan Tam, Oi-Ying Wong, Chi-Wah Kok, Hei Wong, Albert Z. H. Wang
A Wideband three-stage rail-to-rail power amplifier driving large capacitive load. APCCAS (2008)
Sergey Shaimeev, Vladimir Gritsenko, Kaupo Kukli, Hei Wong, Eun-Hong Lee, Chungwoo Kim
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition. Microelectron. Reliab. 47 (1) (2007)
Hei Wong, V. Filip, C. K. Wong, P. S. Chung
Silicon integrated photonics begins to revolutionize. Microelectron. Reliab. 47 (1) (2007)
Y. Fu, Hei Wong, Juin J. Liou
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation. Microelectron. Reliab. 47 (1) (2007)
V. Filip, Hei Wong, D. Nicolaescu
/metal structures. Microelectron. Reliab. 46 (7) (2006)
C. K. Wong, Hei Wong, Mansun Chan, Chi-Wah Kok, H. P. Chan
Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride. Microelectron. Reliab. 46 (12) (2006)
Nian Zhan, M. C. Poon, Hei Wong, K. L. Ng, Chi-Wah Kok
Dielectric breakdown characteristics and interface trapping of hafnium oxide films. Microelectron. J. 36 (1) (2005)
Bing-Liang Yang, P. T. Lai, Hei Wong
Conduction mechanisms in MOS gate dielectric films. Microelectron. Reliab. 44 (5) (2004)
Hei Wong
Low-frequency noise study in electron devices: review and update. Microelectron. Reliab. 43 (4) (2003)
K. L. Ng, Nian Zhan, Chi-Wah Kok, M. C. Poon, Hei Wong
Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing. Microelectron. Reliab. 43 (8) (2003)
Jackie Chan, Hei Wong, M. C. Poon, Chi-Wah Kok
Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride. Microelectron. Reliab. 43 (4) (2003)
V. A. Gritsenko, A. V. Shaposhnikov, Yu. N. Novikov, A. P. Baraban, Hei Wong, G. M. Zhidomirov, M. Roger
Onefold coordinated oxygen atom: an electron trap in the silicon oxide. Microelectron. Reliab. 43 (4) (2003)
Bing-Liang Yang, N. W. Cheung, S. Denholm, J. Shao, Hei Wong, P. T. Lai, Y. C. Cheng
plasma immersion ion implantation. Microelectron. Reliab. 42 (12) (2002)
Hei Wong
Recent developments in silicon optoelectronic devices. Microelectron. Reliab. 42 (3) (2002)
P. G. Han, Hei Wong, Andy H. P. Chan, M. C. Poon
A novel approach for fabricating light-emitting porous polysilicon films. Microelectron. Reliab. 42 (6) (2002)
Hei Wong, V. A. Gritsenko
Defects in silicon oxynitride gate dielectric films. Microelectron. Reliab. 42 (4-5) (2002)
M. C. Poon, Y. Gao, Ted Chi-Wah Kok, A. M. Myasnikov, Hei Wong
SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer. Microelectron. Reliab. 41 (12) (2001)
Hei Wong, P. G. Han, M. C. Poon, Y. Gao
Investigation of the surface silica layer on porous poly-Si thin films. Microelectron. Reliab. 41 (2) (2001)