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Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.
Xuan Feng
Nagarajan Raghavan
Sen Mei
Shurong Dong
Kin Leong Pey
Hei Wong
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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transmission line
electrical properties
data driven
statistical analysis
high voltage
statistical models
silicon dioxide
data sets
high precision
power supply
image recovery
recovery algorithm