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Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.

Xuan FengNagarajan RaghavanSen MeiShurong DongKin Leong PeyHei Wong
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • transmission line
  • electrical properties
  • data driven
  • statistical analysis
  • high voltage
  • statistical models
  • silicon dioxide
  • data sets
  • high precision
  • power supply
  • image recovery
  • recovery algorithm