Sen Mei

Publication Activity (10 Years)

Years Active: 2015-2024
Publications (10 Years): 11

Top Topics

Silicon Dioxide

Neural Architecture

Computationally Tractable

Approximate Pattern Matching

Top Venues

Microelectron. Reliab.

Publications

Lei Yang, Sen Mei, Pan Liang, Yan Li, Ling Ma, Jianbo Gao, Huiqin Jiang
A 3D prediction model for benign or malignant of pulmonary nodules based on neural architecture search. Signal Image Video Process. 18 (1) (2024)
Tianshuo Zhou, Sen Mei, Xinze Li, Zhenghao Liu, Chenyan Xiong, Zhiyuan Liu, Yu Gu, Ge Yu
Unlock Multi-Modal Capability of Dense Retrieval via Visual Module Plugin. CoRR (2023)
Zhenghao Liu, Sen Mei, Chenyan Xiong, Xiaohua Li, Shi Yu, Zhiyuan Liu, Yu Gu, Ge Yu
Text Matching Improves Sequential Recommendation by Reducing Popularity Biases. CIKM (2023)
Zhenghao Liu, Sen Mei, Chenyan Xiong, Xiaohua Li, Shi Yu, Zhiyuan Liu, Yu Gu, Ge Yu
Text Matching Improves Sequential Recommendation by Reducing Popularity Biases. CoRR (2023)
Sen Mei, Huiqin Jiang, Ling Ma
YOLO-lung: A Practical Detector Based on Imporved YOLOv4 for Pulmonary Nodule Detection. CISP-BMEI (2021)
Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. IRPS (2020)
Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS (2018)
Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. Microelectron. Reliab. (2018)
Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey
Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction. IRPS (2018)
Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
-based MIM stacks: Computational and physical insight. Microelectron. Reliab. 64 (2016)
Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey
defect size in Ni/dielectric/Si RRAM devices. Microelectron. Reliab. 61 (2016)
Bingbing Li, Juntong Qi, Tianyu Lin, Sen Mei, Dalei Song, Jianda Han
Real-Time Data Acquisition and Model Identification for Powered Parafoil UAV. ICIRA (1) (2015)