SILICON DIOXIDE
Experts
- Hei Wong
- Dennis Sylvester
- Volkan Kursun
- David T. Blaauw
- Hiroshi Iwai
- Kuniyuki Kakushima
- George J. Papaioannou
- Eddy Simoen
- Jijun Xiong
- Giuseppe Currò
- Cor Claeys
- Gaudenzio Meneghesso
- Giovanni De Micheli
- Chi-Wah Kok
- Matteo Meneghini
- Amir Nahir
- Matroni Koutsoureli
- M. C. Poon
- Masahiro Fujita
- Enrico Zanoni
- Saibal Mukhopadhyay
- Paul E. Hasler
- Mohamad Sawan
- Tibor Grasser
- Yikai Su
- Ahmad Hassan
- Pierre-Emmanuel Gaillardon
- Shunpei Yamazaki
- P. T. Lai
- Renato P. Ribas
- J. P. Xu
- Kazuo Tsutsui
- Kiyoshi Kato
- Nagarajan Raghavan
- Chris H. Kim
- Xavier Aymerich
- Mridula Gupta
- Denis Flandre
- André Inácio Reis
Venues
- Microelectron. Reliab.
- Sensors
- IEEE Access
- Microelectron. J.
- OFC
- IRPS
- NEMS
- IEICE Trans. Electron.
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- CoRR
- ISCAS
- IEEE Trans. Ind. Electron.
- ESSDERC
- IEEE J. Solid State Circuits
- DAC
- Proc. IEEE
- IEEE SENSORS
- ICTON
- VLSI Design
- ICECS
- DRC
- IBM J. Res. Dev.
- CICC
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Trans. Very Large Scale Integr. Syst.
- IET Circuits Devices Syst.
- IGARSS
- SIAM J. Appl. Math.
- CCE
- Displays
- IECON
- ASICON
- IAS
- DATE
- EMBC
- 3DIC
- VTS
- ITC
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