SILICON DIOXIDE
Experts
- Hei Wong
- Dennis Sylvester
- David T. Blaauw
- Volkan Kursun
- Hiroshi Iwai
- Kuniyuki Kakushima
- George J. Papaioannou
- Eddy Simoen
- Giuseppe Currò
- Jijun Xiong
- Giovanni De Micheli
- Gaudenzio Meneghesso
- Cor Claeys
- Masahiro Fujita
- P. T. Lai
- Amir Nahir
- Mohamad Sawan
- Ahmad Hassan
- Paul E. Hasler
- Matroni Koutsoureli
- Tibor Grasser
- Enrico Zanoni
- Shunpei Yamazaki
- Chi-Wah Kok
- Saibal Mukhopadhyay
- Matteo Meneghini
- M. C. Poon
- Pierre-Emmanuel Gaillardon
- Yikai Su
- Xavier Aymerich
- Avi Ziv
- Florence Azaïs
- Philippe Godignon
- Siegfried Selberherr
- Denis Flandre
- Kun-Shan Chen
- Joris Van Campenhout
- Mridula Gupta
- Abdelkarim Mercha
Venues
- Microelectron. Reliab.
- Sensors
- Microelectron. J.
- IEEE Access
- OFC
- IRPS
- NEMS
- IEICE Trans. Electron.
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- ISCAS
- CoRR
- IEEE Trans. Ind. Electron.
- ESSDERC
- IEEE J. Solid State Circuits
- DAC
- Proc. IEEE
- IEEE SENSORS
- ICTON
- ICECS
- VLSI Design
- DRC
- IBM J. Res. Dev.
- CICC
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Trans. Very Large Scale Integr. Syst.
- IGARSS
- IET Circuits Devices Syst.
- SIAM J. Appl. Math.
- CCE
- ASICON
- IECON
- Displays
- DATE
- IAS
- 3DIC
- EMBC
- ITC
- IEEE Trans. Geosci. Remote. Sens.
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