George J. Papaioannou

Publication Activity (10 Years)

Years Active: 2004-2018
Publications (10 Years): 8

Top Topics

Gate Dielectrics

Electrical Properties

Room Temperature

Top Venues

Microelectron. Reliab.

Publications

D. Birmpiliotis, Matroni Koutsoureli, J. Kohylas, George J. Papaioannou, A. Ziaei
dielectric films for MEMS capacitive switches. Microelectron. Reliab. (2018)
Matroni Koutsoureli, George Stavrinidis, D. Birmpiliotis, George Konstantinidis, George J. Papaioannou
films with embedded CNTs for MEMS capacitive switches. Microelectron. Reliab. (2017)
Matroni Koutsoureli, N. Siannas, George J. Papaioannou
Temperature accelerated discharging processes through the bulk of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. (2017)
Matroni Koutsoureli, A. Zevgolatis, S. Saada, C. Mer-Calfati, Loukas Michalas, George J. Papaioannou, Philippe Bergonzo
Dielectric charging phenomena in diamond films used in RF MEMS capacitive switches: The effect of film thickness. Microelectron. Reliab. 64 (2016)
Matroni Koutsoureli, D. Birmpiliotis, Loukas Michalas, George J. Papaioannou
An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches. Microelectron. Reliab. 64 (2016)
Matroni Koutsoureli, Loukas Michalas, E. Papandreou, George J. Papaioannou
dielectric films used in RF MEMS capacitive switches. Microelectron. Reliab. 55 (9-10) (2015)
Loukas Michalas, Matroni Koutsoureli, E. Papandreou, Flavio Giacomozzi, George J. Papaioannou
Dielectric charging effects in floating electrode MEMS capacitive switches. Microelectron. Reliab. 55 (9-10) (2015)
Panagiotis Giounanlis, Elena Blokhina, Orla Feely, Loukas Michalas, Matroni Koutsoureli, George J. Papaioannou
Modelling of the dynamical behaviour of floating electrode MEMS. ISCAS (2015)
Matroni Koutsoureli, Loukas Michalas, Anestis Gantis, George J. Papaioannou
A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches. Microelectron. Reliab. 54 (9-10) (2014)
Matroni Koutsoureli, Loukas Michalas, P. Martins, E. Papandreou, A. Leuliet, S. Bansropun, George J. Papaioannou, A. Ziaei
Properties of contactless and contacted charging in MEMS capacitive switches. Microelectron. Reliab. 53 (9-11) (2013)
Loukas Michalas, Anurag Garg, Ayyaswamy Venkattraman, Matroni Koutsoureli, Alina A. Alexeenko, Dimitrios Peroulis, George J. Papaioannou
A study of field emission process in electrostatically actuated MEMS switches. Microelectron. Reliab. 52 (9-10) (2012)
Loukas Michalas, Anastasia Syntychaki, Matroni Koutsoureli, George J. Papaioannou, Apostolos T. Voutsas
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs. Microelectron. Reliab. 52 (9-10) (2012)
Matroni Koutsoureli, Loukas Michalas, George J. Papaioannou
Temperature effects on the bulk discharge current of dielectric films of MEMS capacitive switches. Microelectron. Reliab. 52 (9-10) (2012)
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51 (9-11) (2011)
Matroni Koutsoureli, George J. Papaioannou
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches. Microelectron. Reliab. 51 (9-11) (2011)
Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectron. Reliab. 51 (12) (2011)
Loukas Michalas, George J. Papaioannou, Apostolos T. Voutsas
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress. Microelectron. Reliab. 50 (9-11) (2010)
Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50 (9-11) (2010)
Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49 (9-11) (2009)
Usama Zaghloul, George J. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectron. Reliab. 49 (9-11) (2009)
M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectron. Reliab. 49 (9-11) (2009)
Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48 (8-9) (2008)
A. Belarni, Mohamed Lamhamdi, Patrick Pons, Laurent Boudou, J. Guastavino, Y. Segui, George J. Papaioannou, Robert Plana
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. Microelectron. Reliab. 48 (8-9) (2008)
Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48 (8-9) (2008)
Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, George J. Papaioannou, Robert Plana
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48 (8-9) (2008)
Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48 (8-9) (2008)
Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectron. Reliab. 47 (9-11) (2007)
Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47 (12) (2007)
E. Papandreou, Mohamed Lamhamdi, C. M. Skoulikidou, Patrick Pons, George J. Papaioannou, Robert Plana
Structure dependent charging process in RF MEMS capacitive switches. Microelectron. Reliab. 47 (9-11) (2007)
M. A. Exarchos, E. Papandreou, Patrick Pons, Mohamed Lamhamdi, George J. Papaioannou, Robert Plana
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46 (9-11) (2006)
M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45 (9-11) (2005)
M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. Microelectron. Reliab. 45 (9-11) (2005)
M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectron. Reliab. 44 (9-11) (2004)
Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44 (9-11) (2004)