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Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques.

Despina C. MoschouM. A. ExarchosDimitrios N. KouvatsosGeorge J. PapaioannouApostolos T. Voutsas
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • thin film
  • random access memory
  • high speed
  • stochastic local search
  • neural network
  • multi layer
  • design considerations