M. A. Exarchos

Publication Activity (10 Years)

Years Active: 2004-2009
Publications (10 Years): 0

Publications

M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectron. Reliab. 49 (9-11) (2009)
Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Aggeliki Arapoyanni, Apostolos T. Voutsas
Reliability and defectivity comparison of n- and p-channel SLS ELA polysilicon TFTs fabricated with a novel crystallization technique. Microelectron. Reliab. 48 (8-9) (2008)
Despina C. Moschou, M. A. Exarchos, Dimitrios N. Kouvatsos, George J. Papaioannou, Apostolos T. Voutsas
Performance and reliability of SLS ELA polysilicon TFTs fabricated with novel crystallization techniques. Microelectron. Reliab. 47 (9-11) (2007)
Loukas Michalas, M. A. Exarchos, George J. Papaioannou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas
An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors. Microelectron. Reliab. 47 (12) (2007)
M. A. Exarchos, E. Papandreou, Patrick Pons, Mohamed Lamhamdi, George J. Papaioannou, Robert Plana
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46 (9-11) (2006)
M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45 (9-11) (2005)
M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. Microelectron. Reliab. 45 (9-11) (2005)
M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectron. Reliab. 44 (9-11) (2004)
Dimitrios N. Kouvatsos, Vojkan Davidovic, George J. Papaioannou, Ninoslav Stojadinovic, Loukas Michalas, M. A. Exarchos, Apostolos T. Voutsas, Dimitrios Goustouridis
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors. Microelectron. Reliab. 44 (9-11) (2004)