François Dieudonné

Publication Activity (10 Years)

Years Active: 2001-2004
Publications (10 Years): 0

Publications

M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra
On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs. Microelectron. Reliab. 44 (9-11) (2004)
François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra
Low frequency noise in 0.12 mum partially and fully depleted SOI technology. Microelectron. Reliab. 43 (2) (2003)
François Dieudonné, F. Daugé, Jalal Jomaah, C. Raynaud, Francis Balestra
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectron. Reliab. 41 (9-10) (2001)