Login / Signup
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's.
François Dieudonné
F. Daugé
Jalal Jomaah
C. Raynaud
Francis Balestra
Published in:
Microelectron. Reliab. (2001)
Keyphrases
</>
decision making
multiresolution
computer vision
information systems
image processing