F. Daugé

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

François Dieudonné, F. Daugé, Jalal Jomaah, C. Raynaud, Francis Balestra
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectron. Reliab. 41 (9-10) (2001)