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On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs.

M. A. ExarchosFrançois DieudonnéJalal JomaahGeorge J. PapaioannouFrancis Balestra
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • machine learning
  • information retrieval
  • learning algorithm
  • search algorithm
  • constraint satisfaction
  • defect classification