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- Rahul Pandita
- Michel Renovell
- Shuhei Watanabe
- Manas Kamal Bhuyan
- Yen-Chang Huang
- Takahiko Horiuchi
- B. V. K. Vijaya Kumar
- Joan Figueras
- Sandip Halder
- Bram Kruseman
- Yongjune Kim
- Rosa Rodríguez-Montañés
- Sze-Teng Liong
- Bappaditya Dey
- Yuji Iwahori
- Yee Siang Gan
- Camelia Hora
- Qiwu Luo
- Stefan Eichenberger
- Daniel Arumí
- Gianni D'Angelo
- Michael Kaufmann
- Patrizio Angelini
- Joakim Bruslund Haurum
- Salvatore Rampone
- Hemerson Pistori
- Hang Shao
- Xiang Wang
- Md. Tarek Habib
- Laurie A. Williams
- Michael A. Bekos
- Ram Chillarege
- Yongxiong Wang
- Vincenzo Roselli
- Thomas B. Moeslund
- Chuanfei Hu
- Faruk Yildirim
- Jie Liu
- Tobias Schlagenhauf
Venues
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- IEEE Trans. Instrum. Meas.
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- Microelectron. Reliab.
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- Commun. Nonlinear Sci. Numer. Simul.
- IRPS
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- J. Electron. Test.
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- ESEM
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- VLSI Design
- IEEE Trans. Very Large Scale Integr. Syst.
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- DATE
- IEEE Des. Test Comput.
- Asian Test Symposium
- J. Electronic Imaging
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- IEEE Trans. Ind. Electron.
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- Int. J. Prod. Res.
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