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Experts
- Rahul Pandita
- Shuhei Watanabe
- Sze-Teng Liong
- Manas Kamal Bhuyan
- Yongjune Kim
- Takahiko Horiuchi
- B. V. K. Vijaya Kumar
- Camelia Hora
- Bappaditya Dey
- Yuji Iwahori
- Michel Renovell
- Yen-Chang Huang
- Rosa Rodríguez-Montañés
- Sandip Halder
- Joan Figueras
- Bram Kruseman
- Yee Siang Gan
- Qiwu Luo
- Michael A. Bekos
- Joakim Bruslund Haurum
- Yongxiong Wang
- Vincenzo Roselli
- Laurie A. Williams
- Hemerson Pistori
- Patrizio Angelini
- Salvatore Rampone
- Hang Shao
- Thomas B. Moeslund
- Michael Kaufmann
- Md. Tarek Habib
- Xiang Wang
- Daniel Arumí
- Chuanfei Hu
- Gianni D'Angelo
- Ram Chillarege
- Stefan Eichenberger
- Guiyun Tian
- Wei-Chao Chen
- Nam Ik Cho
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- ITC
- IEEE Access
- Microelectron. Reliab.
- VTS
- IJCNN
- ATS
- Appl. Soft Comput.
- Expert Syst. Appl.
- J. Electron. Test.
- Commun. Nonlinear Sci. Numer. Simul.
- J. Intell. Manuf.
- Multim. Tools Appl.
- IRPS
- ESEM
- Empir. Softw. Eng.
- Mach. Vis. Appl.
- VLSI Design
- Asian Test Symposium
- DATE
- IEEE Trans. Very Large Scale Integr. Syst.
- ICPR
- Pattern Recognit.
- IEEE Des. Test Comput.
- Comput. Ind. Eng.
- ICACT
- CompSysTech
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Softw.
- DFT
- Eng. Appl. Artif. Intell.
- ICSME
- IEEE Trans. Inf. Theory
- LATS
- CVPR
- FPGA
- J. Electronic Imaging
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