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Experts
- Rahul Pandita
- Bram Kruseman
- Sze-Teng Liong
- Michel Renovell
- Joan Figueras
- Yuji Iwahori
- Manas Kamal Bhuyan
- Yongjune Kim
- Bappaditya Dey
- Sandip Halder
- Camelia Hora
- B. V. K. Vijaya Kumar
- Yen-Chang Huang
- Shuhei Watanabe
- Takahiko Horiuchi
- Yee Siang Gan
- Rosa Rodríguez-Montañés
- Qiwu Luo
- Ram Chillarege
- Vincenzo Roselli
- Chuanfei Hu
- Hang Shao
- Patrizio Angelini
- Stefan Eichenberger
- Daniel Arumí
- Michael A. Bekos
- Gianni D'Angelo
- Joakim Bruslund Haurum
- Yongxiong Wang
- Thomas B. Moeslund
- Xiang Wang
- Laurie A. Williams
- Michael Kaufmann
- Hemerson Pistori
- Md. Tarek Habib
- Salvatore Rampone
- Xiaoxin Fang
- Jizhong Xiao
- Ilhan Aydin
Venues
- CoRR
- Sensors
- IEEE Trans. Instrum. Meas.
- ITC
- IEEE Access
- Microelectron. Reliab.
- IJCNN
- VTS
- Commun. Nonlinear Sci. Numer. Simul.
- Multim. Tools Appl.
- Expert Syst. Appl.
- ATS
- Appl. Soft Comput.
- J. Intell. Manuf.
- J. Electron. Test.
- IRPS
- Comput. Ind. Eng.
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- ICPR
- Asian Test Symposium
- VLSI Design
- ESEM
- Mach. Vis. Appl.
- Pattern Recognit.
- DATE
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Des. Test Comput.
- IEEE Softw.
- Int. J. Syst. Assur. Eng. Manag.
- Eng. Appl. Artif. Intell.
- ETS
- CompSysTech
- J. Electronic Imaging
- Prod. Eng.
- ICSE
- Quantum Inf. Process.
- ICSE (Companion Volume)
- ICSME
- ISVLSI
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