Camelia Hora

Publication Activity (10 Years)

Years Active: 2002-2013
Publications (10 Years): 0

Top Topics

Wavelet Packet Transform

Defect Detection

Model Based Diagnosis

Top Venues

IEEE Des. Test Comput.

IEEE Trans. Instrum. Meas.

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (2) (2013)
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman
Diagnosis of Local Spot Defects in Analog Circuits. IEEE Trans. Instrum. Meas. 61 (10) (2012)
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29 (5) (2012)
Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE (2011)
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
Defect Oriented Testing for analog/mixed-signal devices. ITC (2011)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (12) (2011)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19 (12) (2011)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of full open defects in interconnect lines with fan-out. ETS (2010)
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
Impact of Temperature on Test Quality. VLSI Design (2010)
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC (2009)
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC (2008)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Full Open Defects in Nanometric CMOS. VTS (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Full Open Defects in Interconnecting Lines. VTS (2007)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS (2007)
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
Extending gate-level diagnosis tools to CMOS intra-gate faults. IET Comput. Digit. Tech. 1 (6) (2007)
Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. VTS (2006)
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
Stuck-open fault diagnosis with stuck-at model. ETS (2005)
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
A novel stuck-at based method for transistor stuck-open fault diagnosis. ITC (2005)
Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge
Trends in Testing Integrated Circuits. ITC (2004)
Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
Systematic Defects in Deep Sub-Micron Technologies. ITC (2004)
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electron. Test. 19 (4) (2003)
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS (2003)
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
An Effective Diagnosis Method to Support Yield Improvement. ITC (2002)