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Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents.

Daniel ArumíRosa Rodríguez-MontañésJoan FiguerasStefan EichenbergerCamelia HoraBram Kruseman
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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