Daniel Arumí

Publication Activity (10 Years)

Years Active: 2005-2024
Publications (10 Years): 10

Top Topics

Random Number Generator

Defect Classification

Software Development Life Cycle

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

V. Mahboubi, Á. Gómez, Antonio Calomarde, Daniel Arumí, R. Rodríguez, Salvador Manich
On the Fine Tuning of RRAM Resistance Under Variability Using Current Pulses at SET. IOLTS (2024)
Maryam Akbari, Sattar Mirzakuchaki, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Francesca Campabadal, Mireia Bargallo González, Rosa Rodríguez-Montañés
True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. IEEE Access 11 (2023)
V. Mahboubi, Daniel Arumí, Álvaro Gómez-Pau, R. Rodríguez, Salvador Manich
On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data. DCIS (2022)
Binbin Yang, Daniel Arumí, Salvador Manich, Álvaro Gómez-Pau, Rosa Rodríguez-Montañés, Juan Bautista Roldán, Mireia Bargallo González, Francesca Campabadal, Liang Fang
Simulation of serial RRAM cell based on a Verilog-A compact model. DCIS (2021)
P. Albiol, Salvador Manich, Daniel Arumí, Rosa Rodríguez-Montañés, A. Gómez-Pau
Low Cost AES Protection Against DPA Using Rolling Codes. DCIS (2021)
Binbin Yang, Nuo Xu, Cheng Li, Chenglong Huang, Desheng Ma, Jiahao Liu, Daniel Arumí, Liang Fang
A forming-free ReRAM cell with low operating voltage. IEICE Electron. Express 17 (22) (2020)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras
Postbond Test of Through-Silicon Vias With Resistive Open Defects. IEEE Trans. Very Large Scale Integr. Syst. 27 (11) (2019)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents. IEEE Trans. Very Large Scale Integr. Syst. 24 (5) (2016)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
Prebond Testing of Weak Defects in TSVs. IEEE Trans. Very Large Scale Integr. Syst. 24 (4) (2016)
Daniel Arumí, Salvador Manich, Rosa Rodríguez-Montañés
RRAM based cell for hardware security applications. IVSW (2016)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras
Post-bond test of Through-Silicon Vias with open defects. ETS (2014)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
Pre-bond testing of weak defects in TSVs. IOLTS (2014)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (2) (2013)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
BIST architecture to detect defects in tsvs during pre-bond testing. ETS (2013)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (12) (2011)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19 (12) (2011)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of full open defects in interconnect lines with fan-out. ETS (2010)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
Delay caused by resistive opens in interconnecting lines. Integr. 42 (3) (2009)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
Experimental Characterization of CMOS Interconnect Open Defects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (1) (2008)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Full Open Defects in Nanometric CMOS. VTS (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Full Open Defects in Interconnecting Lines. VTS (2007)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS (2007)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras
Defective behaviours of resistive opens in interconnect lines. ETS (2005)