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Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
Rosa Rodríguez-Montañés
Daniel Arumí
Joan Figueras
Stefan Eichenberger
Camelia Hora
Bram Kruseman
Published in:
ITC (2008)
Keyphrases
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high speed
hough transform
line segments
line drawings
defect classification
real world
information systems
decision making
evolutionary algorithm
straight line
travel time
defect detection
automated visual inspection