Stefan Eichenberger

Publication Activity (10 Years)

Years Active: 2002-2013
Publications (10 Years): 0

Top Topics

Operating Conditions

Diagnostic Tests

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (2) (2013)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (12) (2011)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19 (12) (2011)
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger
Defect-oriented cell-internal testing. ITC (2010)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of full open defects in interconnect lines with fan-out. ETS (2010)
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
Impact of Temperature on Test Quality. VLSI Design (2010)
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC (2009)
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC (2008)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Full Open Defects in Nanometric CMOS. VTS (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Full Open Defects in Interconnecting Lines. VTS (2007)
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
Memory Testing Under Different Stress Conditions: An Industrial Evaluation CoRR (2007)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS (2007)
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24 (3) (2007)
Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
Power Supply Noise in Delay Testing. ITC (2006)
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
Memory testing improvements through different stress conditions. ESSCIRC (2005)
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE (2005)
Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker
ITC 2003 Roundtable: Design for Manufacturability. IEEE Des. Test Comput. 21 (2) (2004)
Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
Systematic Defects in Deep Sub-Micron Technologies. ITC (2004)
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
On Hazard-free Patterns for Fine-delay Fault Testing. ITC (2004)
Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger
Delay Defect Screening using Process Monitor Structures. VTS (2004)
Stefan Eichenberger
Design for Manufacturability - or the meaning of 'subtle'. ITC (2003)
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electron. Test. 19 (4) (2003)
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS (2003)
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
An Effective Diagnosis Method to Support Yield Improvement. ITC (2002)