Erik H. Volkerink

Publication Activity (10 Years)

Years Active: 2001-2010
Publications (10 Years): 0

Publications

Ron Press, Erik H. Volkerink
The ABCs of ITC. IEEE Des. Test Comput. 27 (5) (2010)
Donghwi Lee, Erik H. Volkerink, Intaik Park, Jeff Rearick
Empirical Validation of Yield Recovery Using Idle-Cycle Insertion. IEEE Des. Test Comput. 24 (4) (2007)
Erik H. Volkerink, Subhasish Mitra
Response compaction with any number of unknowns using a new LFSR architecture. DAC (2005)
Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra
Speed Clustering of Integrated Circuits. ITC (2004)
Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger
Delay Defect Screening using Process Monitor Structures. VTS (2004)
Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra
ELF-Murphy Data on Defects and Test Sets. VTS (2004)
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. J. Electron. Test. 19 (2) (2003)
Erik H. Volkerink, Subhasish Mitra
Efficient Seed Utilization for Reseeding based Compression. VTS (2003)
Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC (2003)
Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges
Test Economics for Multi-site Test with Modern Cost Reduction Techniques. VTS (2002)
Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra
Test Vector Compression Using EDA-ATE Synergies. VTS (2002)
Erik H. Volkerink, Ajay Khoche, Subhasish Mitra
Packet-Based Input Test Data Compression Techniques. ITC (2002)
Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC (2001)