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ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume.

Harald P. E. VrankenFriedrich HapkeSoenke RoggeDomenico ChindamoErik H. Volkerink
Published in: ITC (2003)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data sets
  • training set
  • feature vectors
  • support vector machine
  • small number
  • software engineering
  • training samples
  • unseen data