TEST CASES
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Tsong Yueh Chen
- Gordon Fraser
- Lionel C. Briand
- Matteo Sonza Reorda
- Robert M. Hierons
- Tao Xie
- Mark Harman
- Franz Wotawa
- Gregg Rothermel
- Yves Le Traon
- Andrea Arcuri
- Vishwani D. Agrawal
- Antonia Bertolino
- Janusz Rajski
- W. Eric Wong
- Atif M. Memon
- Hideo Fujiwara
- T. H. Tse
- Michael Felderer
- Mary Jean Harrold
- Seiji Kajihara
- Paolo Tonella
- Lu Zhang
- Sandeep K. Gupta
- Kewal K. Saluja
- Abhijit Chatterjee
- Jacob A. Abraham
- Sarfraz Khurshid
- Mike Papadakis
- Erik Jan Marinissen
- Kwang-Ting Cheng
- Vahid Garousi
- Said Hamdioui
- José Carlos Maldonado
- Fevzi Belli
- Zhenyu Chen
Venues
- CoRR
- ITC
- ICST
- VTS
- IEEE Trans. Software Eng.
- ICST Workshops
- ICSE
- J. Syst. Softw.
- J. Electron. Test.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ASE
- Asian Test Symposium
- IEEE Access
- ISSTA
- Inf. Softw. Technol.
- Softw. Test. Verification Reliab.
- DATE
- ISSRE
- ACM SIGSOFT Softw. Eng. Notes
- IEEE Trans. Computers
- IACR Cryptol. ePrint Arch.
- COMPSAC
- DAC
- Sensors
- SEKE
- IEEE Softw.
- ESEC/SIGSOFT FSE
- ETS
- VLSI Design
- ICSM
- IEEE Des. Test Comput.
- Electron. Colloquium Comput. Complex.
- IEEE Trans. Instrum. Meas.
- Commun. ACM
- QSIC
- APSEC
- SAC
- IEEE Trans. Very Large Scale Integr. Syst.
- Softw. Qual. J.
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