TEST CASES
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Tsong Yueh Chen
- Gordon Fraser
- Lionel C. Briand
- Matteo Sonza Reorda
- Robert M. Hierons
- Tao Xie
- Franz Wotawa
- Mark Harman
- Gregg Rothermel
- Yves Le Traon
- Andrea Arcuri
- Vishwani D. Agrawal
- Antonia Bertolino
- Janusz Rajski
- W. Eric Wong
- Atif M. Memon
- Hideo Fujiwara
- T. H. Tse
- Mary Jean Harrold
- Michael Felderer
- Seiji Kajihara
- Lu Zhang
- Sandeep K. Gupta
- Paolo Tonella
- Kewal K. Saluja
- Sarfraz Khurshid
- Abhijit Chatterjee
- Jacob A. Abraham
- Mike Papadakis
- Erik Jan Marinissen
- Kwang-Ting Cheng
- Said Hamdioui
- Vahid Garousi
- Fevzi Belli
- José Carlos Maldonado
- Zhenyu Chen
Venues
- CoRR
- ITC
- ICST
- VTS
- ICST Workshops
- IEEE Trans. Software Eng.
- ICSE
- J. Electron. Test.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ASE
- J. Syst. Softw.
- Asian Test Symposium
- ISSTA
- Softw. Test. Verification Reliab.
- IEEE Access
- Inf. Softw. Technol.
- ISSRE
- DATE
- ACM SIGSOFT Softw. Eng. Notes
- IEEE Trans. Computers
- IACR Cryptol. ePrint Arch.
- COMPSAC
- DAC
- SEKE
- Sensors
- IEEE Softw.
- ESEC/SIGSOFT FSE
- ETS
- VLSI Design
- ICSM
- IEEE Des. Test Comput.
- Electron. Colloquium Comput. Complex.
- IEEE Trans. Instrum. Meas.
- Commun. ACM
- QSIC
- SAC
- IEEE Trans. Very Large Scale Integr. Syst.
- Softw. Qual. J.
- APSEC
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