Sandeep K. Gupta

Publication Activity (10 Years)

Years Active: 1988-2023
Publications (10 Years): 15

Top Venues

VTS

ISQED

ATS

DATE

Publications

Eliel Aknin, Ariel Larey, Julie M. Caldwell, Margaret H. Collins, Juan P. Abonia, Seema S. Aceves, Nicoleta C. Arva, Mirna Chehade, Evan S. Dellon, Nirmala Gonsalves, Sandeep K. Gupta, John Leung, Kathryn A. Peterson, Tetsuo Shoda, Jonathan M. Spergel, Marc E. Rothenberg, Yonatan Savir
Harnessing Digital Pathology And Causal Learning To Improve Eosinophilic Esophagitis Dietary Treatment Assignment. CoRR (2023)
Mingye Li, Fangzhou Wang, Sandeep K. Gupta
Methods for testing path delay and static faults in RSFQ circuits. VTS (2022)
Soowang Park, Jae-Won Nam, Sandeep K. Gupta
HW-BCP: A Custom Hardware Accelerator for SAT Suitable for Single Chip Implementation for Large Benchmarks. ASP-DAC (2021)
Xuan Zuo, Sandeep K. Gupta
Aging-resilient SRAM design: an end-to-end framework. VTS (2020)
Mingye Li, Fangzhou Wang, Sandeep K. Gupta
Data-driven fault model development for superconducting logic. ITC (2020)
Fangzhou Wang, Sandeep K. Gupta
Multi-cell characterization: Developing robust cells and abstraction for Rapid Single Flux Quantum (RSFQ) Logic. ITC (2019)
Fangzhou Wang, Sandeep K. Gupta
Automatic Test Pattern Generation for timing verification and delay testing of RSFQ circuits. VTS (2019)
Soowang Park, Sandeep K. Gupta
Cache Design for Yield-per-Area Maximization: Switchable Spare Columns with Disabling (SSC-Disable). VTS (2019)
Jianwei Zhang, Sandeep K. Gupta, William G. J. Halfond
A New Method for Software Test Data Generation Inspired by D-algorithm. VTS (2019)
Xuan Zuo, Sandeep K. Gupta
Asymmetric sizing: An effective design approach for SRAM cells against BTI aging. VTS (2017)
Jizhe Zhang, Sandeep K. Gupta
Wordline overdriving test: An effective predictive testing method for SRAMs against BTI aging. ISQED (2017)
Jizhe Zhang, Sandeep K. Gupta
SRAM yield-per-area optimization under spatially-correlated process variation. VTS (2016)
Xuan Zuo, Sandeep K. Gupta
Process variation oriented delay testing of SRAMs. VTS (2016)
Jianwei Zhang, Sandeep K. Gupta
Using hardware testing approaches to improve software testing: Undetectable mutant identification. VTS (2016)
Jizhe Zhang, Sandeep K. Gupta
Yield estimation and statistical design of memristor cross-point memory systems. ISQED (2016)
Bowen Zheng, Yue Gao, Qi Zhu, Sandeep K. Gupta
Analysis and optimization of soft error tolerance strategies for real-time systems. CODES+ISSS (2015)
Da Cheng, Sandeep K. Gupta
PPB: Partially-working processors binning for maximizing wafer utilization. VTS (2015)
Hsunwei Hsiung, Sandeep K. Gupta
A multi-layered methodology for defect-tolerance of datapath modules in processors. VTS (2015)
Jizhe Zhang, Sandeep K. Gupta
SRAM Array Yield Estimation under Spatially-Correlated Process Variation. ATS (2014)
Da Cheng, Sandeep K. Gupta
Optimizing redundancy design for chip-multiprocessors for flexible utility functions. ITC (2014)
Byeongju Cha, Sandeep K. Gupta
A Resizing Method to Minimize Effects of Hardware Trojans. ATS (2014)
Prasanjeet Das, Sandeep K. Gupta
Efficient post-silicon validation via segmentation of process variation envelope - Global vs local variations. ISQED (2014)
Da Cheng, Fangzhou Wang, Feng Gao, Sandeep K. Gupta
Optimal Redundancy Designs for CNFET-Based Circuits. ATS (2014)
Da Cheng, Sandeep K. Gupta
Maximizing Yield per Area of Highly Parallel CMPs Using Hardware Redundancy. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33 (10) (2014)
Yue Gao, Sandeep K. Gupta, Yanzhi Wang, Massoud Pedram
An energy-aware fault tolerant scheduling framework for soft error resilient cloud computing systems. DATE (2014)
Byeongju Cha, Sandeep K. Gupta
Trojan detection via delay measurements: a new approach to select paths and vectors to maximize effectiveness and minimize cost. DATE (2013)
Prasanjeet Das, Sandeep K. Gupta
Extending pre-silicon delay models for post-silicon tasks: Validation, diagnosis, delay testing, and speed binning. VTS (2013)
Da Cheng, Hsunwei Hsiung, Bin Liu, Jianing Chen, Jia Zeng, Ramesh Govindan, Sandeep K. Gupta
A New March Test for Process-Variation Induced Delay Faults in SRAMs. Asian Test Symposium (2013)
Yue Gao, Sandeep K. Gupta, Melvin A. Breuer
Using explicit output comparisons for fault tolerant scheduling (FTS) on modern high-performance processors. DATE (2013)
Hsunwei Hsiung, Da Cheng, Bin Liu, Ramesh Govindan, Sandeep K. Gupta
Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations. Asian Test Symposium (2013)
Yue Gao, Yanzhi Wang, Sandeep K. Gupta, Massoud Pedram
An energy and deadline aware resource provisioning, scheduling and optimization framework for cloud systems. CODES+ISSS (2013)
Prasanjeet Das, Sandeep K. Gupta
Gate delay modeling for pre- and post-silicon timing related tasks for ultra-low power CMOS circuits. ICCD (2013)
Da Cheng, Sandeep K. Gupta
A systematic methodology to improve yield per area of highly-parallel CMPs. DFT (2012)
Bin Liu, Hsunwei Hsiung, Da Cheng, Ramesh Govindan, Sandeep K. Gupta
Towards systematic roadmaps for networked systems. HotNets (2012)
Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta, Shahin Nazarian
Theory of redundancy for logic circuits to maximize yield/area. ISQED (2012)
Byeongju Cha, Sandeep K. Gupta
Efficient Trojan Detection via Calibration of Process Variations. Asian Test Symposium (2012)
Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta
A design flow to maximize yield/area of physical devices via redundancy. ITC (2012)
Hsunwei Hsiung, Byeongju Cha, Sandeep K. Gupta
Salvaging chips with caches beyond repair. DATE (2012)
Doochul Shin, Sandeep K. Gupta
A new circuit simplification method for error tolerant applications. DATE (2011)
Prasanjeet Das, Sandeep K. Gupta
On Generating Vectors for Accurate Post-Silicon Delay Characterization. Asian Test Symposium (2011)
Da Cheng, Sandeep K. Gupta
A novel software-based defect-tolerance approach for application-specific embedded systems. ICCD (2011)
Jae Chul Cha, Sandeep K. Gupta
Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. Asian Test Symposium (2011)
Kun Young Chung, Sandeep K. Gupta
Design and test of latch-based circuits to maximize performance, yield, and delay test quality. ITC (2010)
Shamim Begum, Ahmed Helmy, Sandeep K. Gupta
Modeling the interactions between MAC and higher layer: A systematic approach to generate high-level scenarios from MAC-layer scenarios. ACM Trans. Model. Comput. Simul. 21 (1) (2010)
Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta
HYPER: A Heuristic for Yield/Area imProvEment Using Redundancy in SoC. Asian Test Symposium (2010)
Doochul Shin, Sandeep K. Gupta
Approximate logic synthesis for error tolerant applications. DATE (2010)
Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta
Algorithms to maximize yield and enhance yield/area of pipeline circuitry by insertion of switches and redundant modules. DATE (2010)
Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee
Tolerance of performance degrading faults for effective yield improvement. ITC (2009)
Shamim Begum, Ahmed Helmy, Sandeep K. Gupta
Modeling and test generation for worst-case performance evaluation of MAC protocols for wireless ad hoc networks. MASCOTS (2009)
Carlos Cordeiro, Romano Fantacci, Sandeep K. Gupta, Joseph A. Paradiso, Asim Smailagic, Mani B. Srivastava
Body Area Networking: Technology and Applications. IEEE J. Sel. Areas Commun. 27 (1) (2009)
Kun Young Chung, Sandeep K. Gupta
Efficient Scheduling of Path Delay Tests for Latch-Based Circuits. VTS (2009)
Mohammad Mirza-Aghatabar, Melvin A. Breuer, Sandeep K. Gupta
SIRUP: Switch Insertion in RedUndant Pipeline Structures for Yield and Yield/Area Improvement. Asian Test Symposium (2009)
Zhigang Jiang, Sandeep K. Gupta
Threshold Testing: Improving Yield for Nanoscale VLSI. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28 (12) (2009)
I-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty
An Industrial Case Study of Sticky Path-Delay Faults. VTS (2008)
I-De Huang, Yi-Shing Chang, Suriyaprakash Natarajan, Ramesh Sharma, Sandeep K. Gupta
On Accelerating Path Delay Fault Simulation of Long Test Sequences. ITC (2008)
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
A Multi-valued Algebra for Capacitance Induced Crosstalk Delay Faults. ATS (2008)
Jae Chul Cha, Sandeep K. Gupta
Characterization of granularity and redundancy for SRAMs for optimal yield-per-area. ICCD (2008)
Jae Chul Cha, Sandeep K. Gupta
Data Partitioning and Placement Schemes for Matrix Multiplications on a PIM Architecture. ISPDC (2008)
Doochul Shin, Sandeep K. Gupta
A Re-design Technique for Datapath Modules in Error Tolerant Applications. ATS (2008)
Jung-Yup Kang, Sandeep K. Gupta, Jean-Luc Gaudiot
An Efficient Data-Distribution Mechanism in a Processor-In-Memory (PIM) Architecture Applied to Motion Estimation. IEEE Trans. Computers 57 (3) (2008)
Jae Chul Cha, Sandeep K. Gupta
Matrix Inversion on a PIM (Processor-in-Memory). CSSE (3) (2008)
Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer
Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults. ATS (2007)
I-De Huang, Sandeep K. Gupta
On Generating Vectors That Invoke High Circuit Delays - Delay Testing and Dynamic Timing Analysis. ATS (2007)
Shamim Begum, Sandeep K. Gupta, Ahmed Helmy
Performance Analysis of Wireless MAC Protocols Using a Search Based Framework. MASCOTS (2007)
Hugo Cheung, Sandeep K. Gupta
Accurate modeling and fault simulation of Byzantine resistive bridges. ICCD (2007)
Shideh Shahidi, Sandeep K. Gupta
ERTG: A test generator for error-rate testing. ITC (2007)
Lei Wang, Sandeep K. Gupta, Melvin A. Breuer
Diagnosis of delay faults due to resistive bridges, delay variations and defects. ATS (2006)
Shahin Nazarian, Massoud Pedram, Sandeep K. Gupta, Melvin A. Breuer
STAX: statistical crosstalk target set compaction. DATE Designers' Forum (2006)
Kun Young Chung, Sandeep K. Gupta
Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. VTS (2006)
Seongmoon Wang, Sandeep K. Gupta
LT-RTPG: a new test-per-scan BIST TPG for low switching activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (8) (2006)
Sandeep K. Gupta, Michael A. Inerfield, Jingbo Wang
A 1-GS/s 11-bit ADC With 55-dB SNDR, 250-mW Power Realized by a High Bandwidth Scalable Time-Interleaved Architecture. IEEE J. Solid State Circuits 41 (12) (2006)
Shideh Shahidi, Sandeep K. Gupta
Estimating Error Rate during Self-Test via One's Counting. ITC (2006)
Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer
Test Generation for Weak Resistive Bridges. ATS (2006)
Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer
Multiple tests for each gate delay fault: higher coverage and lower test application cost. ITC (2005)
I-De Huang, Sandeep K. Gupta
Selection of Paths for Delay Testing. Asian Test Symposium (2005)
Zhigang Jiang, Sandeep K. Gupta
Threshold testing: Covering bridging and other realistic faults. Asian Test Symposium (2005)
Wichian Sirisaengtaksin, Sandeep K. Gupta
A Methodology to Compute Bounds on Crosstalk Effects in Arbitrary Interconnects. Asian Test Symposium (2005)
Ahmed Helmy, Sandeep K. Gupta
FOTG: fault-oriented stress testing of IP multicast. IEEE Commun. Lett. 9 (4) (2005)
Shirin Ebrahimi-Taghizadeh, Ahmed Helmy, Sandeep K. Gupta
TCP vs. TCP: a systematic study of adverse impact of short-lived TCP flows on long-lived TCP flows. INFOCOM (2005)
Lei Wang, Sandeep K. Gupta, Melvin A. Breuer
Modeling and Simulation for Crosstalk Aggravated by Weak-Bridge Defects between On-Chip Interconnects. Asian Test Symposium (2004)
Melvin A. Breuer, Sandeep K. Gupta, Shahin Nazarian
Efficient Identification of Crosstalk Induced Slowdown Targets. Asian Test Symposium (2004)
Melvin A. Breuer, Sandeep K. Gupta, T. M. Mak
Defect and Error Tolerance in the Presence of Massive Numbers of Defects. IEEE Des. Test Comput. 21 (3) (2004)
Karim Seada, Ahmed Helmy, Sandeep K. Gupta
A framework for systematic evaluation of multicast congestion control protocols. IEEE J. Sel. Areas Commun. 22 (10) (2004)
Shahdad Irajpour, Sandeep K. Gupta, Melvin A. Breuer
Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models. ITC (2004)
Ahmed Helmy, Sandeep K. Gupta, Deborah Estrin
The STRESS method for boundary-point performance analysis of end-to-end multicast timer-suppression mechanisms. IEEE/ACM Trans. Netw. 12 (1) (2004)
Md. Saffat Quasem, Sandeep K. Gupta
Designing Reconfigurable Multiple Scan Chains for Systems-on-Chip. VTS (2004)
Wichian Sirisaengtaksin, Sandeep K. Gupta
Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets. Asian Test Symposium (2004)
Sultan M. Al-Harbi, Sandeep K. Gupta
Generating Complete and Optimal March Tests for Linked Faults in Memories. VTS (2003)
Md. Saffat Quasem, Sandeep K. Gupta
Designing Multiple Scan Chains for Systems-on-Chip. Asian Test Symposium (2003)
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults. Asian Test Symposium (2003)
Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta
Benefits of a SoC-Specific Test Methodology. IEEE Des. Test Comput. 20 (3) (2003)
Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
Test Generation for Maximizing Ground Bounce Considering Circuit Delay. VTS (2003)
Zhigang Jiang, Sandeep K. Gupta
A Test Generation Approach for Systems-on-Chip that Use Intellectual Property Cores. Asian Test Symposium (2003)
Kun Young Chung, Sandeep K. Gupta
Structural Delay Testing of Latch-based High-speed Pipelines with Time Borrowing. ITC (2003)
Shahdad Irajpour, Shahin Nazarian, Lei Wang, Sandeep K. Gupta, Melvin A. Breuer
Analyzing Crosstalk in the Presence of Weak Bridge Defects. VTS (2003)
Nabil M. Abdulrazzaq, Sandeep K. Gupta
Path-Delay Fault Simulation for Circuits with Large Numbers of Paths for Very Large Test Sets. VTS (2003)
I-De Huang, Sandeep K. Gupta, Melvin A. Breuer
Accurate and Efficient Static Timing Analysis with Crosstalk. ICCD (2002)
Zhigang Jiang, Sandeep K. Gupta
An ATPG for Threshold Testing: Obtaining Acceptable Yield in Future Processes. ITC (2002)
Wichian Sirisaengtaksin, Sandeep K. Gupta
Enhanced Crosstalk Fault Model and Methodology to Generate Tests for Arbitrary Inter-core Interconnect Topology. Asian Test Symposium (2002)
Seongmoon Wang, Sandeep K. Gupta
An automatic test pattern generator for minimizing switching activity during scan testing activity. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (8) (2002)

Sandeep K. Gupta.css-eqlu8i{font-size:small;padding-left:4px;}

Publication Activity (10 Years)

Top Topics

Top Venues

Sandeep K. Gupta