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On Accelerating Path Delay Fault Simulation of Long Test Sequences.

I-De HuangYi-Shing ChangSuriyaprakash NatarajanRamesh SharmaSandeep K. Gupta
Published in: ITC (2008)
Keyphrases
  • test sequences
  • test cases
  • bit rate
  • fault diagnosis
  • database
  • test generation
  • simulation model
  • video sequences
  • shortest path
  • three dimensional
  • training data
  • image quality
  • path planning
  • transmission line