TEST GENERATION
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Gordon Fraser
- Tsong Yueh Chen
- Vishwani D. Agrawal
- Tao Xie
- Krishnendu Chakrabarty
- Corina S. Pasareanu
- Andrea Arcuri
- Hideo Fujiwara
- Jacob A. Abraham
- Lionel C. Briand
- Sarfraz Khurshid
- Prabhat Mishra
- Mark Harman
- Gregg Rothermel
- Kewal K. Saluja
- Michael S. Hsiao
- Yves Le Traon
- Raimund Ubar
- W. Eric Wong
- Andy Zaidman
- Robert M. Hierons
- Cristian Cadar
- Seiji Kajihara
- Nikolai Tillmann
- Kwang-Ting Cheng
- Mike Papadakis
- T. H. Tse
- Janak H. Patel
- Melvin A. Breuer
- Sandeep K. Gupta
- Xiaoqing Wen
- Antonia Bertolino
- Jaan Raik
- Matteo Sonza Reorda
- Rudolf Ramler
- Lingming Zhang
- Willem Visser
Venues
- CoRR
- ITC
- DAC
- ICST
- ICST Workshops
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Software Eng.
- DATE
- ASE
- Softw. Test. Verification Reliab.
- ISSTA
- Asian Test Symposium
- VTS
- ICSE
- Inf. Softw. Technol.
- J. Syst. Softw.
- ACM SIGSOFT Softw. Eng. Notes
- ESEC/SIGSOFT FSE
- ISSRE
- J. Electron. Test.
- ICCAD
- IEEE Trans. Computers
- IEEE Des. Test Comput.
- VLSI Design
- SEKE
- ASP-DAC
- COMPSAC
- QSIC
- Softw. Qual. J.
- ACM Trans. Softw. Eng. Methodol.
- ACM Trans. Design Autom. Electr. Syst.
- ETS
- IEEE Access
- Empir. Softw. Eng.
- ICTSS
- ICCD
- AST
- SAC
- IEEE Trans. Very Large Scale Integr. Syst.
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