Xiaoqing Wen

ORCID

Publication Activity (10 Years)

Years Active: 1990-2024
Publications (10 Years): 121

Top Venues

ATS

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

ITC-Asia

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Aibin Yan, Yu Chen, Zhongyu Gao, Tianming Ni, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell. IEEE Trans. Circuits Syst. II Express Briefs 71 (4) (2024)
Tianming Ni, Xiaoqing Wen, Hussam Amrouch, Cheng Zhuo, Peilin Song
Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware. ACM Trans. Design Autom. Electr. Syst. 29 (1) (2024)
Qingping Zhang, Wenfa Zhan, Xiaoqing Wen
A new die-level flexible design-for-test architecture for 3D stacked ICs. Integr. 97 (2024)
Vaibhav Jain, Devendra Kumar Sharma, Hari Mohan Gaur, Ashutosh Kumar Singh, Xiaoqing Wen
Comprehensive and Comparative Analysis of QCA-based Circuit Designs for Next-generation Computation. ACM Comput. Surv. 56 (5) (2024)
Zhengfeng Huang, Liting Sun, Xu Wang, Huaguo Liang, Yingchun Lu, Aibin Yan, Jun Pan, Xiaoqing Wen
NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization. IEEE Trans. Aerosp. Electron. Syst. 60 (4) (2024)
Aibin Yan, Han Bao, Wangjin Jiang, Jie Cui, Zhengfeng Huang, Xiaoqing Wen
Efficient design approaches to CMOS full adder circuits. Microelectron. J. 149 (2024)
Aibin Yan, Zhixing Li, Zhongyu Gao, Jing Zhang, Zhengfeng Huang, Tianming Ni, Jie Cui, Xiaolei Wang, Patrick Girard, Xiaoqing Wen
MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (7) (2024)
Aibin Yan, Litao Wang, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS. IEEE Trans. Very Large Scale Integr. Syst. 32 (1) (2024)
Aibin Yan, Zhuoyuan Lin, Guangzhu Liu, Qingyang Zhang, Zhengfeng Huang, Jie Cui, Xiaoqing Wen, Patrick Girard
Nonvolatile and SEU-Recoverable Latch Based on FeFET and CMOS for Energy-Harvesting Devices. ISCAS (2024)
Aibin Yan, Chen Dong, Xing Guo, Jie Song, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen
IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2024)
Aibin Yan, Zhen Zhou, Liang Ding, Jie Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology. DATE (2023)
Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia (2023)
Aibin Yan, Shaojie Wei, Zhixing Li, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of Low-Cost Approximate CMOS Full Adders. ISCAS (2023)
Aibin Yan, Xuehua Li, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen
A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery. DSA (2023)
Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia (2023)
Zhenyu Guan, Zhiting Liu, Xiaoqing Wen, Qinjun Wan, Wenhan Xu
Trusted fingerprint localization for multimedia devices based on blockchain. Inf. Sci. 643 (2023)
Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. ATS (2023)
Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS (2023)
Aibin Yan, Shaojie Wei, Jinjun Zhang, Jie Cui, Jie Song, Tianming Ni, Patrick Girard, Xiaoqing Wen
A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2023)
Dongyu Xu, Yiming Ouyang, Wu Zhou, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen
RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel. IEEE Trans. Very Large Scale Integr. Syst. 31 (12) (2023)
Tianming Ni, Fei Li, Qingsong Peng, Senling Wang, Xiaoqing Wen
A Lightweight and Machine-Learning-Resistant PUF framework based on Nonlinear Structure and Obfuscating Challenges. AsianHOST (2023)
Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. IEEE Des. Test 40 (4) (2023)
Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia (2023)
Shiling Shi, Stefan Holst, Xiaoqing Wen
Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling. MCSoC (2023)
Aibin Yan, Aoran Cao, Zhengfeng Huang, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang
Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications. IEEE Trans. Emerg. Top. Comput. 11 (4) (2023)
Aibin Yan, Jing Xiang, Yang Chang, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications. Microelectron. J. 139 (2023)
Wu Zhou, Yiming Ouyang, Dongyu Xu, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen
Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion. IEEE Trans. Very Large Scale Integr. Syst. 31 (4) (2023)
Aibin Yan, Yang Chang, Jing Xiang, Hao Luo, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen
Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications. ACM Great Lakes Symposium on VLSI (2023)
Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning. ATS (2023)
Shiling Shi, Stefan Holst, Xiaoqing Wen
GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting. IEICE Trans. Inf. Syst. 106 (10) (2023)
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 59 (3) (2023)
Aibin Yan, Runqi Liu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang
Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata. IEEE Trans. Circuits Syst. II Express Briefs 70 (6) (2023)
Senling Wang, Shaoqi Wei, Jun Ma, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi, Akihiro Shimizu, Xiaoqing Wen, Tianming Ni
SASL-JTAG: A Light-Weight Dependable JTAG. DFT (2023)
Deepika Saxena, Ishu Gupta, Rishabh Gupta, Ashutosh Kumar Singh, Xiaoqing Wen
An AI-Driven VM Threat Prediction Model for Multi-Risks Analysis-Based Cloud Cybersecurity. CoRR (2023)
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (6) (2023)
Wenfa Zhan, Luping Zhang, Xuejun Feng, Pan Pan, Xueyuan Cai, Xiaoqing Wen
An equivalent processing method for integrated circuit electrical parameter data using BP neural networks. Microelectron. J. 139 (2023)
Deepika Saxena, Ishu Gupta, Rishabh Gupta, Ashutosh Kumar Singh, Xiaoqing Wen
An AI-Driven VM Threat Prediction Model for Multi-Risks Analysis-Based Cloud Cybersecurity. IEEE Trans. Syst. Man Cybern. Syst. 53 (11) (2023)
Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. ATS (2023)
Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Senling Wang, Xiaoqing Wen
Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (12) (2023)
Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS (2022)
Aibin Yan, Yu Chen, Shukai Song, Zijie Zhai, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2022)
Aibin Yan, Zhen Zhou, Shaojie Wei, Jie Cui, Yong Zhou, Tianming Ni, Patrick Girard, Xiaoqing Wen
A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology. ACM Great Lakes Symposium on VLSI (2022)
Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen
MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator. AsianHOST (2022)
Tianming Ni, Jingchang Bian, Zhao Yang, Mu Nie, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen
Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement. IEEE Des. Test 39 (5) (2022)
Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. VTS (2022)
Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86 (2022)
Aibin Yan, Zhixing Li, Shiwei Huang, Zijie Zhai, Xiangyu Cheng, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard
SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments. DATE (2022)
Aibin Yan, Shukai Song, Jixiang Zhang, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard
Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. ITC-Asia (2022)
Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu
Evaluation and Test of Production Defects in Hardened Latches. IEICE Trans. Inf. Syst. (5) (2022)
Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerg. Top. Comput. 10 (1) (2022)
Qi Xu, Hao Geng, Tianming Ni, Song Chen, Bei Yu, Yi Kang, Xiaoqing Wen
Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (10) (2022)
Aibin Yan, Zhengzheng Fan, Liang Ding, Jie Cui, Zhengfeng Huang, Qijun Wang, Hao Zheng, Patrick Girard, Xiaoqing Wen
Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications. IEEE Trans. Aerosp. Electron. Syst. 58 (1) (2022)
Deepika Saxena, Ishu Gupta, Jitendra Kumar, Ashutosh Kumar Singh, Xiaoqing Wen
A Secure and Multiobjective Virtual Machine Placement Framework for Cloud Data Center. IEEE Syst. J. 16 (2) (2022)
Qi Xu, Hao Geng, Song Chen, Bo Yuan, Cheng Zhuo, Yi Kang, Xiaoqing Wen
GoodFloorplan: Graph Convolutional Network and Reinforcement Learning-Based Floorplanning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (10) (2022)
Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. ITC-Asia (2022)
Qi Xu, Wenhao Sun, Song Chen, Yi Kang, Xiaoqing Wen
Cellular Structure-Based Fault-Tolerance TSV Configuration in 3D-IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41 (5) (2022)
Aibin Yan, Zhihui He, Jing Xiang, Jie Cui, Yong Zhou, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2022)
Kalyan Baita, Amlan Chakrabarti, Biswadeep Chatterjee, Stefan Holst, Xiaoqing Wen
Power and Energy Safe Real-Time Multi-Core Task Scheduling. VLSID (2022)
Aibin Yan, Zhihui He, Jun Zhou, Jie Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications. Microelectron. J. 111 (2021)
Tianming Ni, Zhao Yang, Hao Chang, Xiaoqiang Zhang, Lin Lu, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen
A Novel TDMA-Based Fault Tolerance Technique for the TSVs in 3D-ICs Using Honeycomb Topology. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Aibin Yan, Zijie Zhai, Lele Wang, Jixiang Zhang, Ningning Cui, Tianming Ni, Xiaoqing Wen
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing. ITC-Asia (2021)
Deepika Saxena, Ishu Gupta, Jitendra Kumar, Ashutosh Kumar Singh, Xiaoqing Wen
A Secure and Multi-objective Virtual Machine Placement Framework for Cloud Data Centre. CoRR (2021)
Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. J. Electron. Test. 37 (4) (2021)
Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen
A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch. NANOARCH (2021)
Qi Xu, Junpeng Wang, Hao Geng, Song Chen, Xiaoqing Wen
Reliability-Driven Neuromorphic Computing Systems Design. DATE (2021)
Stefan Holst, Lim Bumun, Xiaoqing Wen
GPU-Accelerated Timing Simulation of Systolic-Array-Based AI Accelerators. ATS (2021)
Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian
On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. IEICE Trans. Inf. Syst. (6) (2021)
Xiaoqing Wen, Zhenyu Guan, Dawei Li, Hanzheng Lyu, Huimin Li
A Blockchain-based Framework for Information Management in Internet of Vehicles. CSCloud/EdgeCom (2021)
Zhenyu Guan, Xiaoqing Wen, Dawei Li, Mai Xu, Haihua Li
A Blockchain-based Verified Locating Scheme for IoT Devices. ISPA/BDCloud/SocialCom/SustainCom (2021)
Xiaoqing Wen
LSI Testing: A Core Technology to a Successful LSI Industry. ASICON (2021)
Aibin Yan, Liang Ding, Chuanbo Shan, Haoran Cai, Xiaofeng Chen, Zhanjun Wei, Zhengfeng Huang, Xiaoqing Wen
TPDICE and Sim Based 4-Node-Upset Completely Hardened Latch Design for Highly Robust Computing in Harsh Radiation. ISCAS (2021)
Aibin Yan, Aoran Cao, Zhengzheng Fan, Zhelong Xu, Tianming Ni, Patrick Girard, Xiaoqing Wen
A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments. ACM Great Lakes Symposium on VLSI (2021)
Aibin Yan, Aoran Cao, Kuikui Qian, Liang Ding, Zhihui He, Zhengzheng Fan, Xiaoqing Wen
A Reliable and Low-Cost Flip-Flop Hardened against Double-Node-Upsets. DSA (2021)
Tianming Ni, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (9) (2021)
Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen
Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS. IEEE Trans. Emerg. Top. Comput. 9 (1) (2021)
Aibin Yan, Zhelong Xu, Kang Yang, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (4) (2020)
Tianming Ni, Yao Yao, Hao Chang, Lin Lu, Huaguo Liang, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen
LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (10) (2020)
Aibin Yan, Xiangfeng Feng, Xiaohu Zhao, Hang Zhou, Jie Cui, Zuobin Ying, Patrick Girard, Xiaoqing Wen
HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filterable Latch for Safety-Critical Applications. DAC (2020)
Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard
A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets. ATS (2020)
Aibin Yan, Yafei Ling, Jie Cui, Zhili Chen, Zhengfeng Huang, Jie Song, Patrick Girard, Xiaoqing Wen
Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2020)
Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen
Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. ISCAS (2020)
Aibin Yan, Xiangfeng Feng, Yuanjie Hu, Chaoping Lai, Jie Cui, Zhili Chen, Kohei Miyase, Xiaoqing Wen
Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 56 (2) (2020)
Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. ITC-Asia (2020)
Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. IEEE Trans. Computers 69 (6) (2020)
Aibin Yan, Yan Chen, Yuanjie Hu, Jun Zhou, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets. IEEE Trans. Circuits Syst. (12) (2020)
Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen
Logic Fault Diagnosis of Hidden Delay Defects. ITC (2020)
Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara, Xiaoqing Wen
A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips. IEEE Trans. Emerg. Top. Comput. 8 (3) (2020)
Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. (11) (2020)
Aibin Yan, Yan Chen, Zhelong Xu, Zhili Chen, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low-Power and Low-Orbit Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (5) (2020)
Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu
STAHL: A Novel Scan-Test-Aware Hardened Latch Design. ETS (2019)
Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. Circuits Syst. II Express Briefs (2) (2019)
Massimo Alioto, Magdy S. Abadir, Tughrul Arslan, Chirn Chye Boon, Andreas Burg, Chip-Hong Chang, Meng-Fan Chang, Yao-Wen Chang, Poki Chen, Pasquale Corsonello, Paolo Crovetti, Shiro Dosho, Rolf Drechsler, Ibrahim Abe M. Elfadel, Ruonan Han, Masanori Hashimoto, Chun-Huat Heng, Deukhyoun Heo, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Ajay Joshi, Rajiv V. Joshi, Tanay Karnik, Chulwoo Kim, Tony Tae-Hyoung Kim, Jaydeep Kulkarni, Volkan Kursun, Yoonmyung Lee, Hai Helen Li, Huawei Li, Prabhat Mishra, Baker Mohammad, Mehran Mozaffari Kermani, Makoto Nagata, Koji Nii, Partha Pratim Pande, Bipul C. Paul, Vasilis F. Pavlidis, José Pineda de Gyvez, Ioannis Savidis, Patrick Schaumont, Fabio Sebastiano, Anirban Sengupta, Mingoo Seok, Mircea R. Stan, Mark M. Tehranipoor, Aida Todri-Sanial, Marian Verhelst, Valerio Vignoli, Xiaoqing Wen, Jiang Xu, Wei Zhang, Zhengya Zhang, Jun Zhou, Mark Zwolinski, Stacey Weber
Editorial TVLSI Positioning - Continuing and Accelerating an Upward Trajectory. IEEE Trans. Very Large Scale Integr. Syst. 27 (2) (2019)
Aibin Yan, Yuanjie Hu, Jie Song, Xiaoqing Wen
Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications. DATE (2019)
Zhiyuan Song, Aibin Yan, Jie Cui, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. ITC-Asia (2019)
Stefan Holst, Shiling Shi, Xiaoqing Wen
Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test. PRDC (2019)
Aibin Yan, Zhen Wu, Jing Guo, Jie Song, Xiaoqing Wen
Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout. IEEE Trans. Reliab. 68 (1) (2019)
Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich
Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. ITC (2019)
Aibin Yan, Zhen Wu, Jun Zhou, Yuanjie Hu, Yan Chen, Zuobin Ying, Xiaoqing Wen, Patrick Girard
Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications. ATS (2019)
Kohei Miyase, Yudai Kawano, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara
A Static Method for Analyzing Hotspot Distribution on the LSI. ITC-Asia (2019)
Aibin Yan, Zhen Wu, Lu Lu, Zhili Chen, Jie Song, Zuobin Ying, Patrick Girard, Xiaoqing Wen
Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications. ATS (2019)

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Publication Activity (10 Years)

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Xiaoqing Wen