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A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments.
Aibin Yan
Aoran Cao
Zhengzheng Fan
Zhelong Xu
Tianming Ni
Patrick Girard
Xiaoqing Wen
Published in:
ACM Great Lakes Symposium on VLSI (2021)
Keyphrases
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highly robust
x ray
case study
viewpoint
user interface
design process
engineering design
design methodology
real world
image processing
three dimensional
search space
feature vectors
building blocks
computer aided
high density