Aibin Yan

Publication Activity (10 Years)

Years Active: 2014-2024
Publications (10 Years): 94

Top Topics

Random Number Generator

Factor Authentication

Cmos Technology

Top Venues

IEEE Trans. Aerosp. Electron. Syst.

ACM Great Lakes Symposium on VLSI

Publications

Zhengfeng Huang, Yan Zhang, Lei Ai, Huaguo Liang, Tianming Ni, Tai Song, Aibin Yan
Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy. J. Circuits Syst. Comput. 33 (5) (2024)
Aibin Yan, Yu Chen, Zhongyu Gao, Tianming Ni, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell. IEEE Trans. Circuits Syst. II Express Briefs 71 (4) (2024)
Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. J. Electron. Test. 40 (1) (2024)
Zhengfeng Huang, Liting Sun, Xu Wang, Huaguo Liang, Yingchun Lu, Aibin Yan, Jun Pan, Xiaoqing Wen
NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization. IEEE Trans. Aerosp. Electron. Syst. 60 (4) (2024)
Aibin Yan, Han Bao, Wangjin Jiang, Jie Cui, Zhengfeng Huang, Xiaoqing Wen
Efficient design approaches to CMOS full adder circuits. Microelectron. J. 149 (2024)
Qingsong Peng, Jingchang Bian, Zhengfeng Huang, Senling Wang, Aibin Yan
A Compact TRNG Design for FPGA Based on the Metastability of RO-driven Shift Registers. ACM Trans. Design Autom. Electr. Syst. 29 (1) (2024)
Aibin Yan, Zhixing Li, Zhongyu Gao, Jing Zhang, Zhengfeng Huang, Tianming Ni, Jie Cui, Xiaolei Wang, Patrick Girard, Xiaoqing Wen
MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (7) (2024)
Aibin Yan, Litao Wang, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS. IEEE Trans. Very Large Scale Integr. Syst. 32 (1) (2024)
Aibin Yan, Zhuoyuan Lin, Guangzhu Liu, Qingyang Zhang, Zhengfeng Huang, Jie Cui, Xiaoqing Wen, Patrick Girard
Nonvolatile and SEU-Recoverable Latch Based on FeFET and CMOS for Energy-Harvesting Devices. ISCAS (2024)
Aibin Yan, Chen Dong, Xing Guo, Jie Song, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen
IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2024)
Aibin Yan, Zhen Zhou, Liang Ding, Jie Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology. DATE (2023)
Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia (2023)
Aibin Yan, Shaojie Wei, Zhixing Li, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of Low-Cost Approximate CMOS Full Adders. ISCAS (2023)
Aibin Yan, Xuehua Li, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen
A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery. DSA (2023)
Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia (2023)
Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. ATS (2023)
Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS (2023)
Aibin Yan, Shaojie Wei, Jinjun Zhang, Jie Cui, Jie Song, Tianming Ni, Patrick Girard, Xiaoqing Wen
A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2023)
Zhengfeng Huang, Dongxing Ma, Runwu Ji, Huaguo Liang, Aibin Yan, Tai Song, Tianming Ni
Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. IEEE Trans. Aerosp. Electron. Syst. 59 (6) (2023)
Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. IEEE Des. Test 40 (4) (2023)
Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia (2023)
Zhengfeng Huang, Lanxi Duan, Yan Zhang, Tianming Ni, Aibin Yan
A Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch. IEEE Trans. Aerosp. Electron. Syst. 59 (3) (2023)
Aibin Yan, Aoran Cao, Zhengfeng Huang, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang
Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications. IEEE Trans. Emerg. Top. Comput. 11 (4) (2023)
Aibin Yan, Jing Xiang, Yang Chang, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications. Microelectron. J. 139 (2023)
Aibin Yan, Yang Chang, Jing Xiang, Hao Luo, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen
Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications. ACM Great Lakes Symposium on VLSI (2023)
Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. J. Electron. Test. 39 (3) (2023)
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 59 (3) (2023)
Aibin Yan, Runqi Liu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang
Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata. IEEE Trans. Circuits Syst. II Express Briefs 70 (6) (2023)
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (6) (2023)
Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. ATS (2023)
Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Senling Wang, Xiaoqing Wen
Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (12) (2023)
Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS (2022)
Aibin Yan, Yu Chen, Shukai Song, Zijie Zhai, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2022)
Aibin Yan, Zhen Zhou, Shaojie Wei, Jie Cui, Yong Zhou, Tianming Ni, Patrick Girard, Xiaoqing Wen
A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology. ACM Great Lakes Symposium on VLSI (2022)
Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen
MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator. AsianHOST (2022)
Tianming Ni, Jingchang Bian, Zhao Yang, Mu Nie, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen
Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement. IEEE Des. Test 39 (5) (2022)
Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. VTS (2022)
Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86 (2022)
Aibin Yan, Zhixing Li, Shiwei Huang, Zijie Zhai, Xiangyu Cheng, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard
SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments. DATE (2022)
Tai Song, Zhengfeng Huang, Aibin Yan
Machine learning classification algorithm for VLSI test cost reduction. Integr. 87 (2022)
Aibin Yan, Shukai Song, Jixiang Zhang, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard
Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. ITC-Asia (2022)
Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu
Evaluation and Test of Production Defects in Hardened Latches. IEICE Trans. Inf. Syst. (5) (2022)
Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerg. Top. Comput. 10 (1) (2022)
Aibin Yan, Zhengzheng Fan, Liang Ding, Jie Cui, Zhengfeng Huang, Qijun Wang, Hao Zheng, Patrick Girard, Xiaoqing Wen
Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications. IEEE Trans. Aerosp. Electron. Syst. 58 (1) (2022)
Aibin Yan, Zhihui He, Jing Xiang, Jie Cui, Yong Zhou, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2022)
Aibin Yan, Zhihui He, Jun Zhou, Jie Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications. Microelectron. J. 111 (2021)
Tianming Ni, Zhao Yang, Hao Chang, Xiaoqiang Zhang, Lin Lu, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen
A Novel TDMA-Based Fault Tolerance Technique for the TSVs in 3D-ICs Using Honeycomb Topology. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Aibin Yan, Zijie Zhai, Lele Wang, Jixiang Zhang, Ningning Cui, Tianming Ni, Xiaoqing Wen
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing. ITC-Asia (2021)
Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. J. Electron. Test. 37 (4) (2021)
Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen
A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch. NANOARCH (2021)
Qijun Wang, Aibin Yan, Hua Bao
Intra Coding With Geometric Information for Urban Building Scenes. IEEE Trans. Circuits Syst. Video Technol. 31 (6) (2021)
Aibin Yan, Liang Ding, Chuanbo Shan, Haoran Cai, Xiaofeng Chen, Zhanjun Wei, Zhengfeng Huang, Xiaoqing Wen
TPDICE and Sim Based 4-Node-Upset Completely Hardened Latch Design for Highly Robust Computing in Harsh Radiation. ISCAS (2021)
Aibin Yan, Aoran Cao, Zhengzheng Fan, Zhelong Xu, Tianming Ni, Patrick Girard, Xiaoqing Wen
A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments. ACM Great Lakes Symposium on VLSI (2021)
Aibin Yan, Aoran Cao, Kuikui Qian, Liang Ding, Zhihui He, Zhengzheng Fan, Xiaoqing Wen
A Reliable and Low-Cost Flip-Flop Hardened against Double-Node-Upsets. DSA (2021)
Tianming Ni, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (9) (2021)
Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen
Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS. IEEE Trans. Emerg. Top. Comput. 9 (1) (2021)
Aibin Yan, Zhelong Xu, Kang Yang, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (4) (2020)
Tianming Ni, Yao Yao, Hao Chang, Lin Lu, Huaguo Liang, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen
LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (10) (2020)
Aibin Yan, Xiangfeng Feng, Xiaohu Zhao, Hang Zhou, Jie Cui, Zuobin Ying, Patrick Girard, Xiaoqing Wen
HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filterable Latch for Safety-Critical Applications. DAC (2020)
Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard
A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets. ATS (2020)
Tianming Ni, Dongsheng Liu, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan
Architecture of Cobweb-Based Redundant TSV for Clustered Faults. IEEE Trans. Very Large Scale Integr. Syst. 28 (7) (2020)
Aibin Yan, Yafei Ling, Jie Cui, Zhili Chen, Zhengfeng Huang, Jie Song, Patrick Girard, Xiaoqing Wen
Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2020)
Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen
Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. ISCAS (2020)
Aibin Yan, Xiangfeng Feng, Yuanjie Hu, Chaoping Lai, Jie Cui, Zhili Chen, Kohei Miyase, Xiaoqing Wen
Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 56 (2) (2020)
Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. ITC-Asia (2020)
Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. IEEE Trans. Computers 69 (6) (2020)
Aibin Yan, Yan Chen, Yuanjie Hu, Jun Zhou, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets. IEEE Trans. Circuits Syst. (12) (2020)
Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8 (2020)
Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. (11) (2020)
Aibin Yan, Yan Chen, Zhelong Xu, Zhili Chen, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low-Power and Low-Orbit Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (5) (2020)
Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu
STAHL: A Novel Scan-Test-Aware Hardened Latch Design. ETS (2019)
Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Zhen Wu, Tianming Ni
Design of a Novel Self-Recoverable SRAM Cell Protected Against Soft Errors. DSA (2019)
Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. Circuits Syst. II Express Briefs (2) (2019)
Aibin Yan, Yuanjie Hu, Jie Song, Xiaoqing Wen
Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications. DATE (2019)
Zhiyuan Song, Aibin Yan, Jie Cui, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. ITC-Asia (2019)
Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. VTS (2019)
Aibin Yan, Zhen Wu, Jing Guo, Jie Song, Xiaoqing Wen
Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout. IEEE Trans. Reliab. 68 (1) (2019)
Aibin Yan, Zhen Wu, Jun Zhou, Yuanjie Hu, Yan Chen, Zuobin Ying, Xiaoqing Wen, Patrick Girard
Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications. ATS (2019)
Aibin Yan, Zhen Wu, Lu Lu, Zhili Chen, Jie Song, Zuobin Ying, Patrick Girard, Xiaoqing Wen
Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications. ATS (2019)
Aibin Yan, Jun Zhou, Yuanjie Hu, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets. IEEE Access 7 (2019)
Aibin Yan, Yafei Ling, Kang Yang, Zhili Chen, Maoxiang Yi
Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS. ATS (2018)
Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo
Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. ITC-Asia (2018)
Jiliang Zhang, Xiao Tan, Xiangqi Wang, Aibin Yan, Zheng Qin
T2FA: Transparent Two-Factor Authentication. IEEE Access 6 (2018)
Qian He, Aibin Yan, Chaoping Lai, Yinlei Zhang, Chunming Liu, Zhile Chen, Zhen Wu, Jie Cui, Huaguo Liang
Novel low cost and DNU online self-recoverable RHBD latch design for nanoscale CMOS. ISCAS (2018)
Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi
A single event transient detector in SRAM-based FPGAs. IEICE Electron. Express 14 (12) (2017)
Tianming Ni, Huaguo Liang, Mu Nie, Xiumin Xu, Aibin Yan, Zhengfeng Huang
A Region-Based Through-Silicon via Repair Method for Clustered Faults. IEICE Trans. Electron. (12) (2017)
Aibin Yan, Huaguo Liang, Yingchun Lu, Zhengfeng Huang
A transient pulse dually filterable and online self-recoverable latch. IEICE Electron. Express 14 (2) (2017)
Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Yiming Ouyang, Honghui Deng
Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS. Microelectron. J. 61 (2017)
Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Yiming Ouyang, Huaguo Liang
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology. IEEE Trans. Very Large Scale Integr. Syst. 25 (6) (2017)
Aibin Yan, Zhengfeng Huang, Maoxiang Yi, Jie Cui, Huaguo Liang
HLDTL: High-performance, low-cost, and double node upset tolerant latch design. VTS (2017)
Huaguo Liang, Xin Li, Zhengfeng Huang, Aibin Yan, Xiumin Xu
Highly Robust Double Node Upset Resilient Hardened Latch Design. IEICE Trans. Electron. (5) (2017)
Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xuejun Li
An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. Microelectron. Reliab. 63 (2016)
Aibin Yan, Zhengfeng Huang, Xiangsheng Fang, Xiaolin Xu, Huaguo Liang
Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology. ATS (2016)
Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi
A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology. IEICE Trans. Electron. (12) (2015)
Huaguo Liang, Zhi Wang, Zhengfeng Huang, Aibin Yan
Design of a Radiation Hardened Latch for Low-Power Circuits. ATS (2014)