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Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets.

Zhengfeng HuangHao WangDongxing MaHuaguo LiangYiming OuyangAibin Yan
Published in: J. Electron. Test. (2023)
Keyphrases
  • low overhead
  • high reliability
  • load balancing
  • high precision
  • low cost
  • x ray
  • shared memory
  • power consumption
  • real time
  • metadata
  • database systems
  • high density
  • data streams
  • image matching