Zhengfeng Huang

ORCID

Publication Activity (10 Years)

Years Active: 2003-2024
Publications (10 Years): 123

Top Venues

Microelectron. J.

ATS

IEICE Electron. Express

Integr.

Publications

Zhengfeng Huang, Jingchang Bian, Yankun Lin, Huaguo Liang, Tianming Ni
Design Guidelines and Feedback Structure of Ring Oscillator PUF for Performance Improvement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43 (1) (2024)
Jingchang Bian, Zhengfeng Huang, Yankun Lin, Zhao Yang, Huaguo Liang, Tianming Ni
Reliability analysis and comparison of ring-PUF based on probabilistic models. Microelectron. J. 144 (2024)
Qingsong Peng, Jingchang Bian, Zhengfeng Huang, Senling Wang, Aibin Yan
A Compact TRNG Design for FPGA Based on the Metastability of RO-driven Shift Registers. ACM Trans. Design Autom. Electr. Syst. 29 (1) (2024)
Jingchang Bian, Zhengfeng Huang, Peng Ye, Zhao Yang, Huaguo Liang
A Reliability-Aware Splitting Duty-Cycle Physical Unclonable Function Based on Trade-off Process, Voltage, and Temperature Variations. ACM Trans. Design Autom. Electr. Syst. 29 (1) (2024)
Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia
Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectron. J. 143 (2024)
Aibin Yan, Litao Wang, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS. IEEE Trans. Very Large Scale Integr. Syst. 32 (1) (2024)
Zhengfeng Huang, Zhouyu Gong, Dongxing Ma, Xiaolei Wang, Yingchun Lu, Wenfa Zhan, Huaguo Liang, Tianming Ni
Fault-avoidance C-element based low overhead and TNU-resilient latch. Microelectron. J. 131 (2023)
Aibin Yan, Zhen Zhou, Liang Ding, Jie Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology. DATE (2023)
Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia (2023)
Aibin Yan, Shaojie Wei, Zhixing Li, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of Low-Cost Approximate CMOS Full Adders. ISCAS (2023)
Aibin Yan, Xuehua Li, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen
A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery. DSA (2023)
Hui Xu, Jing Zhou, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Chaoming Liu
LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy. Integr. 91 (2023)
Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia (2023)
Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. ATS (2023)
Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectron. J. 138 (2023)
Zhengfeng Huang, Dongxing Ma, Runwu Ji, Huaguo Liang, Aibin Yan, Tai Song, Tianming Ni
Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. IEEE Trans. Aerosp. Electron. Syst. 59 (6) (2023)
Hui Xu, Rui Zhu, Xia Sun, Xianjin Fang, Pan Qi, Huaguo Liang, Zhengfeng Huang
Novel Critical Gate-Based Circuit Path-Level NBTI-Aware Aging Circuit Degradation Prediction. J. Circuits Syst. Comput. 32 (10) (2023)
Dongyu Xu, Yiming Ouyang, Wu Zhou, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen
RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel. IEEE Trans. Very Large Scale Integr. Syst. 31 (12) (2023)
Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. IEEE Des. Test 40 (4) (2023)
Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia (2023)
Zhengfeng Huang, Lanxi Duan, Yan Zhang, Tianming Ni, Aibin Yan
A Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch. IEEE Trans. Aerosp. Electron. Syst. 59 (3) (2023)
Aibin Yan, Aoran Cao, Zhengfeng Huang, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang
Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications. IEEE Trans. Emerg. Top. Comput. 11 (4) (2023)
Yingchun Lu, Yun Yang, Rong Hu, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang, Yuanming Ma, Tian Chen, Liang Yao
High-efficiency TRNG Design Based on Multi-bit Dual-ring Oscillator. ACM Trans. Reconfigurable Technol. Syst. 16 (4) (2023)
Aibin Yan, Jing Xiang, Yang Chang, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications. Microelectron. J. 139 (2023)
Wu Zhou, Yiming Ouyang, Dongyu Xu, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen
Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion. IEEE Trans. Very Large Scale Integr. Syst. 31 (4) (2023)
Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. J. Electron. Test. 39 (2) (2023)
Aibin Yan, Yang Chang, Jing Xiang, Hao Luo, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen
Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications. ACM Great Lakes Symposium on VLSI (2023)
Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. J. Electron. Test. 39 (3) (2023)
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 59 (3) (2023)
Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42 (6) (2023)
Yongxia Sheng, Huaguo Liang, Bao Fang, Cuiyun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu
Design of approximate Booth multipliers based on error compensation. Integr. 90 (2023)
Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. ATS (2023)
Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Senling Wang, Xiaoqing Wen
Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness. IEEE Trans. Circuits Syst. I Regul. Pap. 70 (12) (2023)
Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen
A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS (2022)
Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jianan Wang, Tai Song, Yingchun Lu
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements. J. Circuits Syst. Comput. 31 (13) (2022)
Aibin Yan, Yu Chen, Shukai Song, Zijie Zhai, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2022)
Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen
MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator. AsianHOST (2022)
Tianming Ni, Jingchang Bian, Zhao Yang, Mu Nie, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen
Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement. IEEE Des. Test 39 (5) (2022)
Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. VTS (2022)
Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86 (2022)
Yanjie Wang, Huaguo Liang, Yuchuan Wang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu
A reconfigurable PUF structure with dual working modes based on entropy separation model. Microelectron. J. 124 (2022)
Tai Song, Zhengfeng Huang, Aibin Yan
Machine learning classification algorithm for VLSI test cost reduction. Integr. 87 (2022)
Liang Yao, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi, Yingchun Lu
M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectron. J. 119 (2022)
Aibin Yan, Shukai Song, Jixiang Zhang, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard
Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. ITC-Asia (2022)
Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerg. Top. Comput. 10 (1) (2022)
Tai Song, Zhengfeng Huang, Xiaohui Guo
RLDA: Valid test pattern identification by machine learning classification method for VLSI test. Microelectron. J. 128 (2022)
Aibin Yan, Zhengzheng Fan, Liang Ding, Jie Cui, Zhengfeng Huang, Qijun Wang, Hao Zheng, Patrick Girard, Xiaoqing Wen
Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications. IEEE Trans. Aerosp. Electron. Syst. 58 (1) (2022)
Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. J. Electron. Test. 38 (1) (2022)
Jianguo Cui, Maoxiang Yi, Di Cao, Liang Yao, Xinyu Wang, Huaguo Liang, Zhengfeng Huang, Haochen Qi, Tianming Ni, Yingchun Lu
Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator. IEEE Trans. Circuits Syst. II Express Briefs 69 (3) (2022)
Aibin Yan, Zhihui He, Jing Xiang, Jie Cui, Yong Zhou, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications. ACM Great Lakes Symposium on VLSI (2022)
Tai Song, Tianming Ni, Zhengfeng Huang, Jinlei Wan
Valid test pattern identification for VLSI adaptive test. Integr. 82 (2022)
Aibin Yan, Zhihui He, Jun Zhou, Jie Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications. Microelectron. J. 111 (2021)
Hui Xu, Cong Sun, Le Zhou, Huaguo Liang, Zhengfeng Huang
Design of a Highly Robust Triple-Node-Upset Self-Recoverable Latch. IEEE Access 9 (2021)
Tianming Ni, Zhao Yang, Hao Chang, Xiaoqiang Zhang, Lin Lu, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen
A Novel TDMA-Based Fault Tolerance Technique for the TSVs in 3D-ICs Using Honeycomb Topology. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Chang Hao, Zhengfeng Huang, Tianming Ni
Kelvin Bridge Structure Based TSV Test for Weak Faults. ITC-Asia (2021)
Zhengfeng Huang, Xiandong Li, Zhouyu Gong, Huaguo Liang, Yingchun Lu, Yiming Ouyang, Tianming Ni
Design of MNU-Resilient latches based on input-split C-elements. Microelectron. J. 116 (2021)
Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen
A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch. NANOARCH (2021)
Xinyu Wang, Huaguo Liang, Yanjie Wang, Liang Yao, Yang Guo, Maoxiang Yi, Zhengfeng Huang, Haochen Qi, Yingchun Lu
High-Throughput Portable True Random Number Generator Based on Jitter-Latch Structure. IEEE Trans. Circuits Syst. I Regul. Pap. 68 (2) (2021)
Zhengfeng Huang, Shangjie Pan, Hao Wang, Huaguo Liang, Tianming Ni
LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. Microelectron. J. 117 (2021)
Tingting Sun, Zhengfeng Huang, Hongdong Zhu, Yanhao Huang, Pengjun Zheng
Congestion Pattern Prediction for a Busy Traffic Zone Based on the Hidden Markov Model. IEEE Access 9 (2021)
Zhengfeng Huang, Hao Wang, Yang Ang, Huaguo Liang, Yiming Ouyang, Tianming Ni
A high-speed and triple-node-upset recovery latch with heterogeneous interconnection. Microelectron. J. 118 (2021)
Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yongxia Sheng, Cuiyun Jiang, Zhengfeng Huang, Yingchun Lu
Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr. 81 (2021)
Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang
A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. ITC-Asia (2021)
Yuanfan Xu, Zhaoliang Zhang, Jincheng Yu, Jianfei Cao, Haolin Dong, Zhengfeng Huang, Yu Wang, Huazhong Yang
GAME: Gaussian Mixture Model Mapping and Navigation Engine on Embedded FPGA. FCCM (2021)
Zhengfeng Huang, Zian Su, Tianming Ni, Qi Xu, Haochen Qi, Yingchun Lu, Manzi Eric, Hui Xu
Cross-Layer Dual Modular Redundancy Hardened Scheme of Flip-Flop Design Based on Sense-Amplifier. J. Circuits Syst. Comput. 30 (5) (2021)
Aibin Yan, Liang Ding, Chuanbo Shan, Haoran Cai, Xiaofeng Chen, Zhanjun Wei, Zhengfeng Huang, Xiaoqing Wen
TPDICE and Sim Based 4-Node-Upset Completely Hardened Latch Design for Highly Robust Computing in Harsh Radiation. ISCAS (2021)
Yuan Zhang, Huaguo Liang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Yingchun Lu
A high reliability physically unclonable function based on multiple tunable ring oscillator. Microelectron. J. 117 (2021)
Zhengfeng Huang, Di Cao, Jianguo Cui, Yingchun Lu, Huaguo Liang, Yiming Ouyang, Tianming Ni, Zhenmin Li
Design of node separated triple-node-upset self-recoverable latch. Microelectron. J. 114 (2021)
Tai Song, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Ying Sun
Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. IEICE Electron. Express 18 (2) (2021)
Yingchun Lu, Xinyu Wang, Yanjie Wang, Yuan Zhang, Liang Yao, Maoxiang Yi, Zhengfeng Huang, Huaguo Liang
Pure Digital Scalable Mixed Entropy Separation Structure for Physical Unclonable Function and True Random Number Generator. IEEE Trans. Very Large Scale Integr. Syst. 29 (11) (2021)
Tianming Ni, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (9) (2021)
Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen
Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS. IEEE Trans. Emerg. Top. Comput. 9 (1) (2021)
Zhengfeng Huang, Xiandong Li, Shangjie Pan, Min Wang, Tianming Ni
A SEU Immune Flip-Flop with Low Overhead. ML4CS (2) (2020)
Aibin Yan, Zhelong Xu, Kang Yang, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (4) (2020)
Qi Xu, Song Chen, Hao Geng, Bo Yuan, Bei Yu, Feng Wu, Zhengfeng Huang
Fault tolerance in memristive crossbar-based neuromorphic computing systems. Integr. 70 (2020)
Tianming Ni, Yao Yao, Hao Chang, Lin Lu, Huaguo Liang, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen
LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39 (10) (2020)
Yingchun Lu, Huaguo Liang, Liang Yao, Xinyu Wang, Haochen Qi, Maoxiang Yi, Cuiyun Jiang, Zhengfeng Huang
Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access 8 (2020)
Tianming Ni, Dongsheng Liu, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan
Architecture of Cobweb-Based Redundant TSV for Clustered Faults. IEEE Trans. Very Large Scale Integr. Syst. 28 (7) (2020)
Aibin Yan, Yafei Ling, Jie Cui, Zhili Chen, Zhengfeng Huang, Jie Song, Patrick Girard, Xiaoqing Wen
Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs. IEEE Trans. Circuits Syst. I Regul. Pap. (3) (2020)
Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen
Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. ISCAS (2020)
Jincheng Yu, Feng Gao, Jianfei Cao, Chao Yu, Zhaoliang Zhang, Zhengfeng Huang, Yu Wang, Huazhong Yang
CNN-based Monocular Decentralized SLAM on embedded FPGA. IPDPS Workshops (2020)
Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. IEEE Trans. Computers 69 (6) (2020)
Tianming Ni, Yue Shu, Hao Chang, Lin Lu, Guangzhen Dai, Shidong Zhu, Chengming Qu, Zhengfeng Huang
CC-RTSV: Cross-Cellular Based Redundant TSV Design for 3D ICs. J. Circuits Syst. Comput. 29 (11) (2020)
Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8 (2020)
Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. (11) (2020)
Aibin Yan, Yan Chen, Zhelong Xu, Zhili Chen, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low-Power and Low-Orbit Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56 (5) (2020)
Tianming Ni, Hao Chang, Shidong Zhu, Lin Lu, Xueyun Li, Qi Xu, Huaguo Liang, Zhengfeng Huang
Temperature-Aware Floorplanning for Fixed-Outline 3D ICs. IEEE Access 7 (2019)
Xuan Li, Lili Lu, Pengjun Zheng, Zhengfeng Huang
Timetable Coordination of the First Trains for Subway Network With Maximum Passenger Perceived Transfer Quality. IEEE Access 7 (2019)
Aibin Yan, Kang Yang, Zhengfeng Huang, Jiliang Zhang, Jie Cui, Xiangsheng Fang, Maoxiang Yi, Xiaoqing Wen
A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application. IEEE Trans. Circuits Syst. II Express Briefs (2) (2019)
Zhiyuan Song, Aibin Yan, Jie Cui, Zhili Chen, Xuejun Li, Xiaoqing Wen, Chaoping Lai, Zhengfeng Huang, Huaguo Liang
A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells. ITC-Asia (2019)
Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. VTS (2019)
Tianming Ni, Hao Chang, Yao Yao, Xueyun Li, Zhengfeng Huang
A Novel Built-In Self-Repair Scheme for 3D Memory. IEEE Access 7 (2019)
Tianming Ni, Hao Chang, Xian Sun, Xia Xiuzhen, Zhengfeng Huang
An enhanced time-to-digital conversion solution for pre-bond TSV dual faults testing. IEICE Electron. Express 16 (3) (2019)
Aibin Yan, Jun Zhou, Yuanjie Hu, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen
Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets. IEEE Access 7 (2019)
Yiming Ouyang, Yang Zhao, Kun Xing, Zhengfeng Huang, Huaguo Liang, Jianhua Li
Design of Wireless Network on Chip with Priority-Based MAC. J. Circuits Syst. Comput. 28 (8) (2019)
Tianming Ni, Hao Chang, Haochen Qi, Zhengfeng Huang
A novel in-field TSV repair method for latent faults. IEICE Electron. Express 15 (23) (2018)
Gaoliang Ma, Huaguo Liang, Liang Yao, Zhengfeng Huang, Maoxiang Yi, Xiumin Xu, Kai Zhou
A Low-Cost High-Efficiency True Random Number Generator on FPGAs. ATS (2018)
Aibin Yan, Zhile Chen, Zhengfeng Huang, Xiangsheng Fang, Maoxiang Yi, Jing Guo
Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique. ITC-Asia (2018)
Zhengfeng Huang, Zhaodong Huang, Pengjun Zheng, Wenjun Xu
Calibration of C-Logit-Based SUE Route Choice Model Using Mobile Phone Data. Inf. 9 (5) (2018)
Xiumin Xu, Huaguo Liang, Kai Zhou, Gaoliang Ma, Zhengfeng Huang, Maoxiang Yi, Tianming Ni, Yingchun Lu
An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs. ATS (2018)

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Publication Activity (10 Years)

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Zhengfeng Huang