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Reliability analysis and comparison of ring-PUF based on probabilistic models.
Jingchang Bian
Zhengfeng Huang
Yankun Lin
Zhao Yang
Huaguo Liang
Tianming Ni
Published in:
Microelectron. J. (2024)
Keyphrases
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reliability analysis
probabilistic model
graphical models
expectation maximization
conditional random fields
bayesian networks
condition monitoring
databases
machine learning
electronic devices