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Reliability analysis and comparison of ring-PUF based on probabilistic models.

Jingchang BianZhengfeng HuangYankun LinZhao YangHuaguo LiangTianming Ni
Published in: Microelectron. J. (2024)
Keyphrases
  • reliability analysis
  • probabilistic model
  • graphical models
  • expectation maximization
  • conditional random fields
  • bayesian networks
  • condition monitoring
  • databases
  • machine learning
  • electronic devices