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- Jong-Myon Kim
- Steven X. Ding
- Xuefeng Chen
- Fengshou Gu
- Andrew D. Ball
- Krishnendu Chakrabarty
- Zhongkui Zhu
- Sudhakar M. Reddy
- Ruqiang Yan
- Chuan Li
- Irith Pomeranz
- Enrico Zio
- Marios M. Polycarpou
- Bin Jiang
- Haidong Shao
- Changqing Shen
- Silvio Simani
- Hiroshi Takahashi
- Khashayar Khorasani
- Shen Yin
- Thomas Parisini
- René-Vinicio Sánchez
- Jianbo Yu
- V. Sugumaran
- Zahoor Ahmad
- Weihua Li
- Yigang He
- Yongbo Li
- Donghua Zhou
- Haiyang Pan
- Michael G. Pecht
- Xingxing Jiang
- Yu Zhang
- Yang Liu
- Pabitra Mohan Khilar
- Weiguo Huang
- Mohamed N. Nounou
- Mehrdad Saif
- Mariela Cerrada
Venues
- Sensors
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Trans. Ind. Electron.
- Reliab. Eng. Syst. Saf.
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- IEEE Trans. Ind. Informatics
- ACC
- Entropy
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- CAA SAFEPROCESS
- Neural Comput. Appl.
- IEEE SENSORS
- IJCNN
- INDIN
- IEEE Trans. Reliab.
- Int. J. Syst. Sci.
- ICRA
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