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Experts
- Jong-Myon Kim
- Steven X. Ding
- Xuefeng Chen
- Fengshou Gu
- Andrew D. Ball
- Krishnendu Chakrabarty
- Zhongkui Zhu
- Ruqiang Yan
- Sudhakar M. Reddy
- Enrico Zio
- Marios M. Polycarpou
- Chuan Li
- Irith Pomeranz
- Bin Jiang
- Haidong Shao
- Changqing Shen
- Silvio Simani
- Hiroshi Takahashi
- Khashayar Khorasani
- Shen Yin
- René-Vinicio Sánchez
- Thomas Parisini
- Jianbo Yu
- Zahoor Ahmad
- Weihua Li
- Yigang He
- V. Sugumaran
- Donghua Zhou
- Haiyang Pan
- Yongbo Li
- Michael G. Pecht
- Yang Liu
- Xingxing Jiang
- Yu Zhang
- Weiguo Huang
- Krishna R. Pattipati
- Hazem N. Nounou
- Janusz Rajski
- Mohamed N. Nounou
Venues
- Sensors
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Trans. Ind. Electron.
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Ind. Informatics
- Expert Syst. Appl.
- IECON
- ACC
- Eng. Appl. Artif. Intell.
- Entropy
- I2MTC
- IEEE Trans. Computers
- Neurocomputing
- CDC
- Appl. Soft Comput.
- J. Intell. Manuf.
- Autom.
- ECC
- Adv. Eng. Informatics
- J. Intell. Fuzzy Syst.
- ICPHM
- IGARSS
- Knowl. Based Syst.
- ITC
- SMC
- EMBC
- Remote. Sens.
- ETFA
- J. Frankl. Inst.
- IEEE Trans. Reliab.
- IAS
- Neural Comput. Appl.
- SAFEPROCESS
- CAA SAFEPROCESS
- ICRA
- Int. J. Autom. Technol.
- IEEE SENSORS
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