Cuiyun Jiang

Publication Activity (10 Years)

Years Active: 2003-2023
Publications (10 Years): 10

Top Topics

Error Compensation

Top Venues

IEICE Electron. Express

Microelectron. J.

Publications

Yongxia Sheng, Huaguo Liang, Bao Fang, Cuiyun Jiang, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu
Design of approximate Booth multipliers based on error compensation. Integr. 90 (2023)
Liang Yao, Huaguo Liang, Qian Han, Hong Zhang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi, Yingchun Lu
M-RO PUF: A portable pure digital RO PUF based on MUX unit. Microelectron. J. 119 (2022)
Bao Fang, Huaguo Liang, Dawen Xu, Maoxiang Yi, Yongxia Sheng, Cuiyun Jiang, Zhengfeng Huang, Yingchun Lu
Approximate multipliers based on a novel unbiased approximate 4-2 compressor. Integr. 81 (2021)
Huaguo Liang, Danqing Li, Zhao Yang, Tianming Ni, Zhengfeng Huang, Cuiyun Jiang
A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs. ITC-Asia (2021)
Yingchun Lu, Huaguo Liang, Liang Yao, Xinyu Wang, Haochen Qi, Maoxiang Yi, Cuiyun Jiang, Zhengfeng Huang
Jitter-Quantizing-Based TRNG Robust Against PVT Variations. IEEE Access 8 (2020)
Maoxiang Yi, Jingchang Bian, Tianming Ni, Cuiyun Jiang, Hao Chang, Huaguo Liang
A Pulse Shrinking-Based Test Solution for Prebond Through Silicon via in 3-D ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38 (4) (2019)
Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yingchun Lu, Aibin Yan, Tianming Ni, Maoxiang Yi
A single event transient detector in SRAM-based FPGAs. IEICE Electron. Express 14 (12) (2017)
Xiumin Xu, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xiangsheng Fang, Tianming Ni, Maoxiang Yi
A highly reliable butterfly PUF in SRAM-based FPGAs. IEICE Electron. Express 14 (14) (2017)
Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Yiming Ouyang, Xuejun Li
An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. Microelectron. Reliab. 63 (2016)
Aibin Yan, Huaguo Liang, Zhengfeng Huang, Cuiyun Jiang, Maoxiang Yi
A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology. IEICE Trans. Electron. (12) (2015)
Wenfa Zhan, Huaguo Liang, Cuiyun Jiang, Zhengfeng Huang, Aiman H. El-Maleh
A scheme of test data compression based on coding of even bits marking and selective output inversion. Comput. Electr. Eng. 36 (5) (2010)
Maoxiang Yi, Huaguo Liang, Kaihua Zhan, Cuiyun Jiang
Optimal LFSR-Coding Test Data Compression Based on Test Cube Dividing. CSE (2) (2009)
Huaguo Liang, Wenfa Zhan, Qiang Luo, Cuiyun Jiang
A Test Vector Compression/Decompression Scheme Based on Logic Operation between Adjacent Bits (LOBAB) Coding. PRDC (2009)
Lei Zhang, Huaguo Liang, Wenfa Zhan, Cuiyun Jiang
Block Marking and Updating Coding in Test Data Compression for SoC. ATS (2007)
Huaguo Liang, Maoxiang Yi, Xiangsheng Fang, Cuiyun Jiang
A BIST Scheme Based on Selecting State Generation of Folding Counters. Asian Test Symposium (2005)
Huaguo Liang, Cuiyun Jiang
Sharing BIST with Multiple Cores for System-on-a-Chip. Asian Test Symposium (2003)