Tai Song

Publication Activity (10 Years)

Years Active: 2019-2024
Publications (10 Years): 16

Top Topics

Top Venues

Microelectron. J.

J. Circuits Syst. Comput.

J. Electron. Test.

Publications

Zhengfeng Huang, Yan Zhang, Lei Ai, Huaguo Liang, Tianming Ni, Tai Song, Aibin Yan
Designs of High-Speed Triple-Node-Upset Hardened Latch Based on Dual-Modular-Redundancy. J. Circuits Syst. Comput. 33 (5) (2024)
Tai Song, Zhengfeng Huang, Li Zhang, Qi Hong, Zhao Yang, Milos Krstic
Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm. IEEE Trans. Circuits Syst. II Express Briefs 71 (7) (2024)
Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia
Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectron. J. 143 (2024)
Zhengfeng Huang, Dongxing Ma, Runwu Ji, Huaguo Liang, Aibin Yan, Tai Song, Tianming Ni
Overhead Optimized and Quadruple-Node-Upset Self-Recoverable Latch Design Based on Looped C-Element Matrix. IEEE Trans. Aerosp. Electron. Syst. 59 (6) (2023)
Liang Huang, Tai Song, Tiezhen Jiang
Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs. Microelectron. J. 131 (2023)
Tai Song, Zhengfeng Huang, Xiaohui Guo, Krstic Milos
Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation. J. Electron. Test. 39 (2) (2023)
Zhengfeng Huang, Wanshu Zhong, Lanxi Duan, Yue Zhang, Huaguo Liang, Jianan Wang, Tai Song, Yingchun Lu
Low-Power Anti-Glitch Double-Edge Triggered Flip-Flop Based on Robust C-Elements. J. Circuits Syst. Comput. 31 (13) (2022)
Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86 (2022)
Tai Song, Zhengfeng Huang, Aibin Yan
Machine learning classification algorithm for VLSI test cost reduction. Integr. 87 (2022)
Tai Song, Zhengfeng Huang, Xiaohui Guo
RLDA: Valid test pattern identification by machine learning classification method for VLSI test. Microelectron. J. 128 (2022)
Liang Huang, Tai Song
VLSI test through an improved LDA classification algorithm for test cost reduction. Microelectron. J. 125 (2022)
Tai Song, Tianming Ni, Zhengfeng Huang, Jinlei Wan
Valid test pattern identification for VLSI adaptive test. Integr. 82 (2022)
Tai Song, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Ying Sun
Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. IEICE Electron. Express 18 (2) (2021)
Tai Song, Huaguo Liang, Tianming Ni, Zhengfeng Huang, Yingchun Lu, Jinlei Wan, Aibin Yan
Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm. IEEE Access 8 (2020)
Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. (11) (2020)
Tai Song, Huaguo Liang, Ying Sun, Zhengfeng Huang, Maoxiang Yi, Xiangsheng Fang, Aibin Yan
Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory. VTS (2019)