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Cost-Effective Path Delay Defect Testing Using Voltage/Temperature Analysis Based on Pattern Permutation.

Tai SongZhengfeng HuangXiaohui GuoKrstic Milos
Published in: J. Electron. Test. (2023)
Keyphrases
  • cost effective
  • low cost
  • statistical analysis
  • neural network
  • real time
  • shortest path
  • data center
  • cost effectiveness