Chaoming Liu

Publication Activity (10 Years)

Years Active: 2017-2024
Publications (10 Years): 14

Top Topics

Simulation Study

Syntactic Information

Top Venues

Microelectron. Reliab.

Publications

Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. J. Electron. Test. 40 (1) (2024)
Hui Xu, Chaoming Liu, Ruijun Ma, Tai Song, Zhengfeng Huang, Jun Wang, Xuewei Qin, Yu Xia
Hardened latch designs based on the characteristic of transistor for mitigating multiple-node-upsets in harsh radiation environments. Microelectron. J. 143 (2024)
Hui Xu, Shuo Zhu, Ruijun Ma, Zhengfeng Huang, Huaguo Liang, Haojie Sun, Chaoming Liu
Design of novel low cost triple-node-upset self-recoverable hardened latch. Integr. 97 (2024)
Hui Xu, Jing Zhou, Ruijun Ma, Huaguo Liang, Zhengfeng Huang, Chaoming Liu
LQNTL: Low-overhead quadruple-node-upset self-recovery latch based on triple-mode redundancy. Integr. 91 (2023)
Chao Yu, Wenhao Zhu, Chaoming Liu, Xiaoyu Zhang, Qiuhong Zhai
SIFTER: A Task-specific Alignment Strategy for Enhancing Sentence Embeddings. CoRR (2023)
Chaoming Liu, Wenhao Zhu, Xiaoyu Zhang, Qiuhong Zhai
Exploiting Syntactic Information to Boost the Fine-tuning of Pre-trained Models. COMPSAC (2022)
Wenhao Zhu, Shuang Liu, Chaoming Liu
Learning multimodal word representation with graph convolutional networks. Inf. Process. Manag. 58 (6) (2021)
Chunhua Qi, Yanqing Zhang, Guoliang Ma, Chaoming Liu, Tianqi Wang, Liyi Xiao, Mingxue Huo, Guofu Zhai
Design of a high-performance 12T SRAM cell for single event upset tolerance. Sci. China Inf. Sci. 64 (11) (2021)
Wenhao Zhu, Shuang Liu, Chaoming Liu
Incorporating Syntactic and Phonetic Information into Multimodal Word Embeddings Using Graph Convolutional Networks. ICASSP (2021)
Wenhao Zhu, Shuang Liu, Chaoming Liu, Xiaoya Yin, Xiaping Xu
Learning Multimodal Word Representations by Explicitly Embedding Syntactic and Phonetic Information. IEEE Access 8 (2020)
Mengtian Bao, Ying Wang, Xingji Li, Chaoming Liu, Cheng-Hao Yu, Fei Cao
Simulation study of single event effects in the SiC LDMOS with a step compound drift region. Microelectron. Reliab. 91 (2018)
Jianqun Yang, Xingji Li, Chaoming Liu, Daniel M. Fleetwood
The effect of ionization and displacement damage on minority carrier lifetime. Microelectron. Reliab. 82 (2018)
Xingji Li, Jianqun Yang, Chaoming Liu, Gang Bai, Wenbo Luo, Pengwei Li
Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. Microelectron. Reliab. 82 (2018)
Xingji Li, Lei Dong, Jianqun Yang, Chaoming Liu
Impact of Passivation Layers on Irradiation Response of PNP Transistors Under Different Dose Rates. IEEE Access 5 (2017)