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Synergistic effects of NPN transistors caused by combined proton irradiations with different energies.

Xingji LiJianqun YangChaoming LiuGang BaiWenbo LuoPengwei Li
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • negative effects
  • power consumption
  • neural network
  • low power
  • monte carlo simulation
  • high density
  • combining multiple
  • circuit design
  • database
  • information systems
  • image sequences
  • higher order
  • fuel cell