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Design of a high-performance 12T SRAM cell for single event upset tolerance.

Chunhua QiYanqing ZhangGuoliang MaChaoming LiuTianqi WangLiyi XiaoMingxue HuoGuofu Zhai
Published in: Sci. China Inf. Sci. (2021)
Keyphrases
  • computer aided
  • user interface
  • neural network
  • case study
  • design tools
  • event driven