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Simulation study of single event effects in the SiC LDMOS with a step compound drift region.
Mengtian Bao
Ying Wang
Xingji Li
Chaoming Liu
Cheng-Hao Yu
Fei Cao
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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simulation study
monte carlo
post processing
single step
neural network
knowledge base
event detection
single point
database
machine learning
genetic algorithm
data streams
hidden markov models
input image
region of interest