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Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm.
Tai Song
Zhengfeng Huang
Li Zhang
Qi Hong
Zhao Yang
Milos Krstic
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2024)
Keyphrases
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k nearest neighbor
classification algorithm
knn
nearest neighbor
classification method
cost reduction
neural network
learning algorithm
support vector machine
text classification
document classification
knn classifier
decision making
support vector machine svm
naive bayes
knn algorithm