Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs.
Tai SongHuaguo LiangZhengfeng HuangTianming NiYing SunPublished in: IEICE Electron. Express (2021)
Keyphrases
- test data
- clustering method
- pairwise
- cost function
- test cases
- experimental evaluation
- detection method
- item response theory
- high precision
- preprocessing
- dynamic programming
- denoising
- test sequences
- classification method
- pattern matching
- high speed
- high accuracy
- data sets
- probabilistic model
- significant improvement
- objective function
- training data
- decision trees
- feature selection