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Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm.
Tai Song
Huaguo Liang
Tianming Ni
Zhengfeng Huang
Yingchun Lu
Jinlei Wan
Aibin Yan
Published in:
IEEE Access (2020)
Keyphrases
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improved algorithm
np hard
learning algorithm
probabilistic model
monte carlo
k means
linear programming
optimal solution
computational complexity
search space
cost function
dynamic programming
upper bound
simulated annealing
pattern matching
knapsack problem