Machine learning classification algorithm for VLSI test cost reduction.
Tai SongZhengfeng HuangAibin YanPublished in: Integr. (2022)
Keyphrases
- classification algorithm
- cost reduction
- machine learning
- support vector machine
- learning algorithm
- k nearest neighbor
- knn
- accurate classification
- training phase
- naive bayes
- training set
- class labels
- machine learning algorithms
- concept drift
- classification method
- natural language processing
- data mining
- lead time
- cost savings
- text classification
- active learning
- text mining
- supervised learning
- knowledge discovery
- natural language
- training data
- feature vectors
- multistage
- data analysis
- decision trees
- clustering algorithm
- image processing
- feature selection
- data sets