RLDA: Valid test pattern identification by machine learning classification method for VLSI test.

Tai Song Zhengfeng Huang Xiaohui Guo

Published in: Microelectron. J. (2022)

Keyphrases

classification method
machine learning
text classification
test data
real world
data mining
pattern recognition
support vector machine
support vector machine svm
neural network
feature extraction
reinforcement learning
machine learning algorithms