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RLDA: Valid test pattern identification by machine learning classification method for VLSI test.
Tai Song
Zhengfeng Huang
Xiaohui Guo
Published in:
Microelectron. J. (2022)
Keyphrases
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classification method
machine learning
text classification
test data
real world
data mining
pattern recognition
support vector machine
support vector machine svm
neural network
feature extraction
reinforcement learning
machine learning algorithms