Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments.
Aibin YanZhelong XuXiangfeng FengJie CuiZhili ChenTianming NiZhengfeng HuangPatrick GirardXiaoqing WenPublished in: IEEE Trans. Emerg. Top. Comput. (2022)