Login / Signup
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision.
Yuqi Pan
Huaguo Liang
Junming Li
Jinxing Qu
Zhengfeng Huang
Maoxiang Yi
Yingchun Lu
Published in:
J. Electron. Test. (2024)
Keyphrases
</>
decision making
decision makers
data sets
decision model
case study
massively parallel
multi user
higher level
data driven
collaborative environment
integrated circuit
decision process
collaborative learning
expert systems
cooperative
decision trees
neural network