Jing Guo

Publication Activity (10 Years)

Years Active: 2013-2022
Publications (10 Years): 11

Top Topics

Cmos Technology

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

IEEE Trans. Circuits Syst. I Regul. Pap.

IEEE Trans. Emerg. Top. Comput.

Publications

Shanshan Liu, Jing Guo, Xiaochen Tang, Pedro Reviriego, Fabrizio Lombardi
A Polarity-Driven Radiation-Hardened Latch design for Single Event Upset Tolerance. DFT (2022)
Jing Guo, Shanshan Liu, Xiaohui Su, Chunhua Qi, Fabrizio Lombardi
High-Performance CMOS Latch Designs for Recovering All Single and Double Node Upsets. IEEE Trans. Aerosp. Electron. Syst. 57 (6) (2021)
Shanshan Liu, Pedro Reviriego, Jing Guo, Jie Han, Fabrizio Lombardi
Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design. IEEE Trans. Emerg. Top. Comput. 9 (4) (2021)
Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen
Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS. IEEE Trans. Emerg. Top. Comput. 9 (1) (2021)
Qiang Li, Xiaohui Su, Jing Guo, Chunhua Qi
Self-Recovery Tolerance Latch Design Based on the Radiation Mechanism. IEEE Access 8 (2020)
Jing Guo, Shanshan Liu, Lei Zhu, Fabrizio Lombardi
Design and Evaluation of Low-Complexity Radiation Hardened CMOS Latch for Double-Node Upset Tolerance. IEEE Trans. Circuits Syst. I Regul. Pap. (6) (2020)
Nan Zhang, Xiaohui Su, Jing Guo
Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology. IEEE Access 8 (2020)
Jing Guo, Shanshan Liu, Lei Zhu, Fabrizio Lombardi
A CMOS Majority Logic Gate and its Application to One-Step ML Decodable Codes. IEEE Trans. Very Large Scale Integr. Syst. 27 (11) (2019)
Jing Guo, Lei Zhu, Yu Sun, Huiliang Cao, Hai Huang, Tianqi Wang, Chunhua Qi, Rongsheng Zhang, Xuebing Cao, Liyi Xiao, Zhigang Mao
Design of Area-Efficient and Highly Reliable RHBD 10T Memory Cell for Aerospace Applications. IEEE Trans. Very Large Scale Integr. Syst. 26 (5) (2018)
Yingzi Zhang, Yulong Hou, Wenyi Liu, Huixin Zhang, Yanjun Zhang, Zhidong Zhang, Jing Guo, Jia Liu, Liang Zhang, Qiu-lin Tan
A Cost-Effective Relative Humidity Sensor Based on Side Coupling Induction Technology. Sensors 17 (5) (2017)
Jing Guo, Lei Zhu, Wenyi Liu, Hai Huang, Shanshan Liu, Tianqi Wang, Liyi Xiao, Zhigang Mao
Novel Radiation-Hardened-by-Design (RHBD) 12T Memory Cell for Aerospace Applications in Nanoscale CMOS Technology. IEEE Trans. Very Large Scale Integr. Syst. 25 (5) (2017)
Liyi Xiao, Jiaqiang Li, Jie Li, Jing Guo
Hardened design based on advanced orthogonal Latin code against two adjacent multiple bit upsets (MBUs) in memories. ISQED (2015)
Shanshan Liu, Liyi Xiao, Jing Guo, Zhigang Mao
Fault Secure Encoder and Decoder Designs for Matrix Codes. CAD/Graphics (2015)
Jing Guo, Liyi Xiao, Tianqi Wang, Shanshan Liu, Xu Wang, Zhigang Mao
Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology. IEEE Trans. Reliab. 64 (2) (2015)
Chunhua Qi, Liyi Xiao, Jing Guo, Tianqi Wang
Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology. Microelectron. Reliab. 55 (6) (2015)
Jing Guo, Liyi Xiao, Zhigang Mao
Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology. IEEE Trans. Circuits Syst. I Regul. Pap. (7) (2014)
Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao
Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code. IEEE Trans. Very Large Scale Integr. Syst. 22 (1) (2014)
Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao
Novel Mixed Codes for Multiple-Cell Upsets Mitigation in Static RAMs. IEEE Micro 33 (6) (2013)