Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology.

Nan Zhang Xiaohui Su Jing Guo

Published in: IEEE Access (2020)

Keyphrases

cmos technology
low power
power consumption
power dissipation
low voltage
computer vision
low cost
efficient implementation
single chip
design process
user interface
object oriented
single image