Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology.

Chunhua Qi Liyi Xiao Jing Guo Tianqi Wang

Published in: Microelectron. Reliab. (2015)

Keyphrases

cmos technology
low power
low cost
highly reliable
power consumption
single chip
high speed
low voltage
power dissipation
mixed signal
low power consumption
spl times
power reduction
digital signal processing
parallel processing
real time
silicon on insulator
x ray
case study